Publikationen 1994-1975

 

1994-1975

später

                                                                  |94 |93 | 92 | 91 | 90 | 89-85 | 84-80 | 79-75 |

 

    • C.Böhm, C. Roths, U. Müller, A. Beyer, E. Kubalek:
      "Electrical characterization of integrated circuits by scanning force microscopy"
      Materials Science and Engineering B24 (1994) 218-222
 
    • C. Böhm, C. Roths, E. Kubalek:
      "Scanning-Force Microscope Test System for Device Internal Test with High Spatial and Temporal Resolution"
      Microelectronic Engineering 24 (1994) 91-98
 
    • G. David, S. Redlich, W. Mertin, E. Kubalek, D. Jäger:
      "Two-dimensional field mapping in coplanar MMIC-components using direct electro-optic probing"
      Microelectronic Engineering 24 (1994) 385-392
 
    • W. Mertin, A. Leyk, F. Taenzler, T.Novak, G. David, D. Jäger, E. Kubalek:
      "Characterization of a MMIC by direct and indirect electro-optic sampling and by network analyzer measurements"
      Microelectronic Engineering 24 (1994) 377-384
 
    • F. Taenzler, W. Mertin, G. David, D. Jäger, E. Kubalek:
      "Experimental Characterization of the Perturbations of Microwave Devices by the Electro-Optic Probe Tip"
      Microelectronic Engineering 24 (1994) 123-130
 
    • M. Schöttler, C. Traub, E. Kubalek:
      "Crosstalk effect in electron beam testing: Simulations and Measurements"
      Microelectronic Engineering 24 (1994) 233-240
 
    • H. Lakner, J. Helmrich, E. Kubalek:
      "Analysis of Ordering in GaInP by CBED"
      ICEM 13-Paris (1994) 885-886
 
    • C. Böhm:
      "Application of Scanning Force Microscopy to MMIC Characterization"
      Proc. 1st European Workshop for Optical Characterization of Electronic Materials (OCEM) Halle (1994)
 
    • K. Helmreich, W. Wolz, M. Batinic:
      "An Optimized Electron Beam Deflection Assembly"
      Microelectronic Engineering 24 (1994) 71-80
 
    • B. Bollig, K.P. Geyzers, M. Heuken:
      "High-resolution Scanning Transmission Electron Microscopy (STEM) and Electron Energy Loss Spectroscopy (EELS) of ZnSxSe1-x/ZnSe Quantum Wells"
      Advanced Materials for Optics and Electronics, Vol. 3 (1994) 183-190
 
    • U. Müller, C. Böhm, J. Sprengepiel, C. Roths, E. Kubalek, A. Beyer:
      "Geometrical and Voltage Resolution of Electrical Sampling Scanning Force Microscopy"
      IEEE MTT-S Intern. Microwave Symposium Digest, Vol. 1 (1994) 1005-1008
 
    • C. Böhm, C. Roths, E. Kubalek:
      "Contactless electrical characterization of MMICs by device internal electrical sampling scanning-force-microscopy"
      IEEE MTT-S Intern. Microwave Symposium Digest, Vol. 3 (1994) 1605-1608
 
    • W. Mertin, A. Leyk, G. David, R.M. Bertenburg, S. Koßlowski, F.J. Tegude, I. Wolff, D. Jäger, E. Kubalek:
      "Two-Dimensional Mapping of Amplitude and Phase of Microwave Fields inside a MMIC using the Direct Electro-Optic Sampling Technique"
      IEEE MTT-S International Microwave Symposium Digest, Vol. 3 (1994) 1597-1600
 
    • B. Bollig, M. Blauermel, W. Taudt, M. Heuken:
      "Cathodoluminescence characterization of Nitrogen-doped ZnSe"
      Journal of Crystal Growth 145 (1994) 562-569
 
    • Th. Kauffeldt, H. Lakner, A. Schmidt-Ott:
      "Measurement of the properties of ultrafine iron oxide particles by means of on-line detection of particle magnetization, TDMA and STEM- analysis"
      Journal of Aerosol Science 25 suppl. 1 (1994) 567-568
 
    • C. Böhm, A. Leyk, J. Sprengepiel, E. Kubalek:
      "Advanced Function- and Failure Analysis of Monolithic Integrated Travelling Wave Amplifiers by Scanning-Force-Microscopy"
      Proc. 24th European Microwave Conference, Vol. 2 (1994) 1495-1500
 
    • Q. Liu, F. Scheffer, A. Lindner, H. Lakner, W. Prost, F.J. Tegude:
      "X-ray characterization of very thin GaxIn1-xP (x0,5) layers grown on InP"
      Materials Science and Engineering B28 (1994) 188-192
 
    • F. Scheffer, A. Lindner, Q. Liu, C. Heedt, R. Reuter, W. Prost, H. Lakner, F.J. Tegude:
      "Highly strained In0,5Ga0,5P as wide-gap material on InP substrate for heterojunction field effect transistor application"
      Journal of Crystal Growth 145 (1994) 326-331
 
    • G. Sölkner, E. Wolfgang, C. Böhm (eingeladene Verö ffentlichung):
      "Advanced Diagnosis Techniques for sub-m Integrated Circuits"
      Proc. 20th ESSCIRC, Ulm, (1994) 11-17
 
    • C. Böhm, J. Bangert, W. Mertin, E. Kubalek:
      "Picosecond Electro-Optic Sampling System with Improved Spatial Resolution using the Technique of a Near Field Scanning Optical Microscope"
      in: Proc. 5th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF) Glasgow, UK (1994) 285-290
 
    • C. Böhm, J. Bangert, W. Mertin, E. Kubalek:
      "Time resolved near-field scanning optical microscopy"
      J. Phys. D: Appl. Phys. 27 (1994) 2237-2240
 
    • K. Kaufmann, K. Orsech, M. Domnik, L.J. Balk:
      "Evaluation of the electron acoustic signal generation in GaAs"< BR> J. Phys. D: Appl. Phys. 27 (1994) 2401-2413
 
    • D.Tönnies, G.Bacher, A.Forchel, A.Waag, Th. Litz, G.Landwehr
      "Optical study of intermixing in CdTe/CdMgTe quantum wells"
      Japanese Journal of Applied Physics 33 (2B); pp. L 247 - L 249, (1994)
 
    • D.Tönnies, G.Bacher, A.Forchel, A.Waag, G.Landwehr
      "Photoluminescence study of strong interdiffusion in CdTe/CdMnTe quantum wells induced by rapid thermal annealing"
      Applied Physics Letters 64 (6), pp. 766 - 768, (1994)
 
    • D.Tönnies, G.Bacher, A.Forchel, A.Waag, D.Hommel, G.Landwehr, M.Heuken
      "Optical study of interdiffusion in CdTe and ZnSe based semiconductor quantum wells"
      Journal of Crystal Growth 138, pp. 362 - 366, (1994)
 
    • G.Bacher, F.Daiminger, A.Waag, A.Forchel, G.Landwehr
      "Many body effects in transient luminescence spectra of homogeneous electron hole-plasmas in CdTe/CdMnTe quantum wells"
      Journal of Crystal Growth 138, pp. 856 - 860, (1994)
 
    • G.Bacher, A. Forchel, A.Waag, G.Landwehr
      "Room temperature stimulated emission from a CdTe/CdMgTe superlattice laser structure in the red spectral range"
      IEEE Photonics Technology Letters 6 (2), pp. 125 - 127, (1994)
 
    • A. Waag, G.Bacher, A. Forchel, A.Waag, G.Landwehr
      "Stimulated emission from a (CdMg)Te separate confinement quantum well laser"
      Journal of Applied Physics 75 (10), pp. 5456 - 5458, (1994)
 
    • M.Illing, G.Bacher, A.Waag, A.Forchel, G.Landwehr
      "Fabrication and optical characterization of wet chemically etched CdTe/CdMgTe wires"
      Journal of Crystal Growth 138, pp. 638 - 642, (1994)
 
    • D.Tönnies, G.Bacher, D. Eisert, A.Forchel, A.Waag, Th. Litz, G.Landwehr
      "Ion-implantation induced interdiffusion in CdTe/CdMgTe quantum wells"
      Applied Physics Letters 65 (25); pp. 3194 - 3196, (1994)

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                                                              | 94 | 93 | 92 | 91 | 90 | 89-85 | 84-80 | 79-75 |
 
    • Q.Liu, H. Lakner, F. Scheffer, A. Lindner, W. Prost:
      "Analysis of ordering in GalnP by means of x-ray diffraction"
      J. Appl. Phys. 73 (6) (1993) 2270 -2774
 
    • J. Kraus, H. Meschede, Q. Liu, W. Prost, F.J. Tegude, H. Lakner, E. Kubalek:
      "InyGa1-yAs/GaAs interface smoothing by GaAs monolayers in highly strained graded superlattice channels (0.2 y 0.4) for pseudomorphic AlxGa 1-xAs/InyGa1-yAsHFET"
      Journal of Crystal Growth 127 (1993) 589-591
 
    • F. Taenzler, T. Novak, E. Kubalek:
      "Contactless Characterization of Microwave Integrated Circuits by Device Internal Indirect Electro-Optic Probing"
      11th IEEE VLSI Test Symposium Digest (1993) 120-122
 
    • M. Wollgarten, H. Lakner, K. Urban:
      "Planar decagonal-phase precipitates in icosahedral Al-Pd-Mn quasicrystals"
      Philosophical Magazine Letters, Vol. 67 No.1 (1993) 9-18
 
    • M. Wollgarten, H. Lakner, K. Urban:
      "A novel planar defect in icosahedral AlPdMn quasicrystals"
      Journal of Non-Crystalline Solids 153&154 (1993) 108-113
 
    • W. Mertin, C. Roths, F. Taenzler, E. Kubalek:
      "Probe tip invasiveness at indirect electro-optic sampling of MMIC"
      IEEE International Microwave Symposium Digest Vol. 3, (1993) 1351-1354
 
    • G. David, S. Redlich, W. Mertin, R.M. Bertenburg, S. Koblowski, F.J. Tegude, E. Kubalek, D. Jäger:
      "Two-dimensional direct electro-optic field mapping in a monolithic integrated GaAs amplifier"
      in: Proc. 23rd European Microwave Conference (1993) 497-499
 
    • G. David, S. Redlich, W. Mertin, R. Tempel, E. Kubalek, I. Wolff, D. Jäger:
      "Electro-Optical Testing of MMICs"
      in: Proc. XXIVth General Assembly of the International Union of Radio Science (URSI), Japan (1993) 569
 
    • H. Lakner, B. Bollig, P. Volmich, Q. Liu, F. Scheffer, A. Lindner, W. Prost:
      "High resolution STEM Z-contrast imaging and XRD: two new approaches for the characterization of GaInP/GaAs heterostructures"
      Inst. Phys. Conf. Ser. No. 134: Section 7 (1993) 497-502
 
    • H. Lakner, B. Bollig, E. Kubalek:
      "High-resolution analysis of semiconducting heterostructures in the scanning transmission electron microscope (STEM)"
      Proc. VIIIth National Conference on Scanning Electron Microscopy and Analytical Methods of Solid State Characterization, Chernogolowska (Moscow District), Russia (1993) 66
 
    • M. Domnik, L.J. Balk:
      "Quantitative scanning electron acoustic microscopy of silicon"
      Scanning Microscopy, Vol. 7, No.1 (1993) 37-48
 
    • K. Kaufmann, L.J. Balk:
      "Electron-beam induced gate currents in GaAs MESFET"
      Inst. Phys. Conf. Ser. No. 134: Section 11 (1993) 725-730
 
    • C. Böhm, F. Saurenbach, P. Taschner, C. Roths, E. Kubalek:
      "Voltage contrast in integrated circuits with 100 nm spatial resolution by scanning force microscopy"
      J. Phys. D: Appl. Phys. 26, (1993) 1801-1805
 
    • F. Taenzler, T. Novak, E. Kubalek:
      "Contactless Characterization of Microwave Integrated Circuits by Device Internal Indirect Electro-Optic Probing"
      Proc. APMC '93, Asia Pacific Microwave Conference Taiwan (1993) Vol. 2, 18/6-11
 
    • A. Stöhr, O. Humbach, S. Zumkley, G. Wingen, G. David, D. Jäger, B. Bollig, E.C. Larkins, J.D. Ralston (eingeladene Veröffentlichung):
      "InGaAs/GaAs multiple-quantum-well modulators and switches"
      Optical and Quantum Electronics 25 (1993) 865-883
 
    • F.Taenzler (eingeladene Veröffentlichung):
      "Indirect Electro-Optic Test System for Function Control and Failure Analysis of Microwave Integrated Circuits"
      Proc. 4th International Symposium on Recent Advances in Microwave Technology,New Delhi, India (1993)
 
    • G.Bacher, C.Hartmann, H.Schweizer, T.Held, G.Mahler, H.Nickel
      "Exciton dynamics in InxGa1-xAs/GaAs quantum well heterostructures: Competition between capture and thermal emission"
      Physical Review B 47 (15), pp. 9545 - 9555, (1993)
 
    • J.Feldmann, T.Meier, G.von Plessen, M.Koch, E.O.Göbel, P.Thomas, G.Bacher, C.Hartmann, H.Schweizer, W.Schäfer, H.Nickel
      "Coherent dynamics of excitonic wavepackets"
      Physical Review Letters 70 (20), pp. 3027 - 3030, (1993)
 
    • D.Tönnies, G.Bacher, A.Forchel, A.Waag, G.Landwehr
      "Optical investigation of interdiffusion in CdTe/CdMnTe quantum wells"
      Materials Science and Engineering B21, pp. 274 - 276, (1993)

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                                                                 | 94 | 93 | 92 | 91 | 90 | 89-85 | 84-80 | 79-75|

 

    • M. Domnik, L.J. Balk:
      "Capacitive Transducers for Scanning Electron Acoustic Microscopy (SEAM)"
      Acoustical Imaging Vol. 19 (1992) 773-777
 
    • K. Kaufmann, P. Koschinski, U. Zinke, L.J. Balk:
      "An Improved Measurement System for the Investigation of Sensitive Specimens by means of Scanning Electron Acoustic Microscopy (SEAM)"
      Acoustical Imaging Vol. 19 (1992) 767-772
 
    • M. Domnik, L.J. Balk:
      "Signal Generation and Contrast Mechanisms in Electron and Photo Acoustic Imaging of Differently Doped Silicon"
      Acoustical Imaging Vol. 19 (1992) 755-759
 
    • M. Schöttler, H.D. Storzer, E. Kubalek:
      "Calculation of the Influence of Electric Fields on Primary and Secondary Electrons in Electron Beam Testing of Submicron Structures"
      Microelectronic Engineering 16 (1992) 497-504
 
    • K. Kaufmann, L.J. Balk:
      "Electron Beam Induced Current (EBIC) Investigations of GaAs-MESFET"
      Microelectronic Engineering 16 (1992) 513-520
 
    • F. Taenzler, E. Kubalek:
      "Use of polymeric materials for external electro-optic probing"
      Microelectronic Engineering 16 (1992) 325-332
 
    • J. Fehr, H. Sinnwell, L.J. Balk, E. Kubalek:
      "Electron beam testing of monolithic integrated micro- and millimeterwave circuits"
      Microelectronic Engineering 16 (1992) 165-172
 
    • H. Lakner, M. Maywald, L.J. Balk, E. Kubalek:
      "Characterization of AlGaAs/GaAs Interfaces by EELS and High Resolution Z-Contrast Imaging in Scanning Transmission Electron Microscopy (STEM)"
      Surface and Interface Analysis Vol. 19 (1992) 374-378
 
    • W. Mertin, C. Böhm, L.J. Balk, E. Kubalek:
      "Two-Dimensional Field Mapping in MMIC-Substrates by Electro-Optic Sampling Technique"
      IEEE MTT-S International Microwave Symposium Digest, Vol. 3, (1992) 1443-1446
 
    • H. Lakner, E. Kubalek, J. Kraus, F.-J. Tegude:
      "High resolution STEM analysis of InGaAs/AlGaAs heterostructures"
      Electron Microscopy Vol. 2 (1992) 139-140
 
    • G. Koschek, A. Lork, B. Bollig:
      "Ursprung der Kathodolumineszenz von Zirkonen"
      Beitr. Elektronenmikroskop. Direktabb. Oberfl. 25 (1992) 125-134
 
    • B. Bollig, P. Thorhauer, E. Kubalek, J. Söllner, F.E.G. Guimaraes, M. Heuken, K. Heime:
      "High resolution scanning transmission electron microscopy (STEM) and luminescence characterization of ZnS/ZnSe multi quantum wells (MQWs) grown by MOVPE"
      Journal of Crystal Growth 124 (1992) 639-646
 
    • G. Li, A. Leyk, L.J. Balk:
      "Spatially Resolved Determination of Photogenerated Temperature and Excess Carrier Distribution in GaAsP"
      Springer Series in Optical Sciences, Vol. 69 (1992) 384-386
 
    • J. Fehr, E. Kubalek:
      "Electron beam test system for GHz-Waveform measurements on transmission lines within MMIC"
      Proc. 22nd European Microwave Conference Helsinki University of Technology, Espoo, Finnland (1992) 163-168
 
    • J. Kraus, H. Meschede, Q. Liu, W. Prost, F.J. Tegude:
      "Novel InyGa1-y/GaAs graded superlattice channel (0.2 y 0.4) for pseudomorphic AlxGa1-xAs/InyGa1-yAs HFET"
      Proc. 16th State-of the-art program on compound semiconductors (SOTAPOCS XVI) (1992) 112-121
 
    • G.Bacher, J.Kovac, K.Streubel, H.Schweizer, F.Scholz
      "Exciton dynamics for extended monolayer islands in thin In0.53Ga0.47As/InP quantum wells"
      Physical Review B 45 (16), pp. 9136 - 9144, (1992)
 
    • G.Bacher, C.Hartmann, H.Schweizer, H.Nickel
      "Resonances of the exciton decay time in strained InxGa1-xAs/GaAs quantum wells"
      18th International Quantum Electronics Conference, Technical Digest Series 1992, Vol.9, pp. 198 - 199, (1992)
 
    • G.Bacher, H.Schweizer, J.Kovac, H.Nickel, W.Schlapp, R.Lösch
      "Correlation between the exciton mobility and the excitonic linewidth in shallow InxGa1-xAs/GaAs quantum wells"
      Applied Physics Letters 61 (6), pp. 702 - 704, (1992)

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                                                              | 94 | 93 | 92 | 91 | 90 | 89-85 | 84-80 | 79-75|

 

    • L.J. Balk:
      "Scanning Acoustic Microscopy"
      Analysis of Microelectronic Materials and Devices, New York (1991) 741-769
 
    • H. Lakner, B. Bollig, E. Kubalek, M. Heuken, K. Heime, F. Scheffer, F.E.G. Guimaraes:
      "Scanning transmission electron microscopy of heterointerfaces grown by metalorganic vapor phase epitaxy (MOVPE)"
      Journal of Crystal Growth 107 (1991) 452-457
 
    • F. Scheffer, M.Josef, W. Prost, F. J. Tegude, H. Lakner, S. Zumkley, G. Wingen, D. Jäger:
      "Growth and characterization of AlGaAs/GaAs Bragg reflectors for non-linear optoelectronic devices"
      Materials Science and Engineering, B9 (1991) 361-364
 
    • H. Lakner, L.J. Balk, E. Kubalek:
      "Spatially resolved EELS of GaAs/GaAlAs heterostructures"
      Microsc. Microanal. Microstruct. 2 (1991) 293-300
 
    • O. Hoinkis, K. Miethe, W. Betz, W.H. Gries:
      "Application of infrared luminescence microscopy for ion beam diagnostics and for measurement of ion dose densities from 10-9 to 10-16 cm-2 "
      Fresenius J Anal Chem (1991) 341: 101-105
 
    • M. Heuken, J. Söllner, W. Bettermann, K. Heime, B. Bollig, E. Kubalek:
      "ZnS/ZnSe/GaAs heterostructures grown by metal-organic vapour phase epitaxy"
      Materials Science and Engineering B9 (1991) 189-193
 
    • H. Lakner, M. Maywald, L.J. Balk, E. Kubalek:
      "Elemental mapping in AlGaAs/GaAs heterostructures using parallel EELS"
      Inst. Phys. Conf. Ser. No 117 Section 2 (1991) 63-68
 
    • K. Kaufmann, P. Koschinski, L.J. Balk:
      "Electron beam radiation effects on the properties of unpassivated GaAs-MESFET"
      Inst. Phys. Conf. Ser. No 117 Section 6 (1991) 363-366
 
    • J.B. Malherbe, H. Lakner, W.H. Gries:
      "Composition and Structure of Ion-bombardment-induced Growth Cones on InP"
      Surface and Interface Analysis, Vol. 17 (1991) 719-725
 
    • J. Fehr, L.J. Balk, W. Reiners:
      "Subpikosekunden-Elektronenstrahlaustastsystem"
      Deutsches Patentamt - Patentschrift DE 39 04 280 C 2
 
    • B. Bollig, H. Lakner, E. Kubalek:
      "Microcharacterization of Heterostructures in Electronic and Optoelectronic Devices by Scanning Transmission Electron Microscopy"
      Festschrift zur Vollendung des 65.Lebensjahres von Prof. Dr. rer.nat. Dr.-Ing.E.h Eckard Macherauch, Deutsche Gesellschaft für Materialkunde (DGM) (1991) 435-446; auch erschienen im gleichen Verlag unter dem Titel: Werkstoffkunde Beiträge zu den Grundlagen und zur interdisziplinären Anwendung
 
    • W. Mertin, E. Kubalek:
      "Laser Beam Testing"
      in: Tagungsband EUROFORM II, Training Session: Contactless Testing of IC, Universität Duisburg, Oktober 1991
 
    • G.Bacher, H.Schweizer, J.Kovac, H.Nickel, W.Schlapp, R.Lösch
      "Thermal emission of carriers in strained InxGa1-xAs/GaAs quantum wells due to a fast interface scattering"
      in Quantum Optoelectronics, 1991, Technical Digest Series, Vol.7 (Optical Society of America, Washington, DC 1988), pp. 150 - 153, (1991)
 
    • G.Bacher, H.Schweizer, J.Kovac, A.Forchel, H.Nickel, W.Schlapp, R.Lösch
      "Influence of barrier height on carrier dynamics in strained InxGa1-xAs/GaAs quantum wells"
      Physical Review B 43 (11), pp. 9312 - 9315, (1991)

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                                                                  | 94 | 93 | 92 | 91 | 90 | 89-85 | 84-80 | 79-75|
    • M. Domnik, L.J. Balk:
      "Evaluation of the Temperature Dependence of Electron Acoustic Signals in Silicon by Use of a Capacitive Transducer"
      Springer Series in Optical Sciences 62 "Photoacoustic and Photothermal Phenomena II" (1990) 245-248
 
    • W. Mertin, K.D. Herrmann, E. Kubalek:
      "Electron Beam Testability of Monolithic Microwave Integrated Circuits (MMIC)"
      Microelectronic Engineering 12 (1990) 287-293
 
    • W. Mertin, K.D. Herrmann, E. Kubalek, R. Lackmann, G. Weichert, G. Zimmer:
      "The Capacitive Coupling Error and the Capacitive Coupling Cross Talk in Electron Beam Testing of Passivated IC and Measures for their Reduction"
      Microelectronic Engineering 12 (1990) 349-357
 
    • J. Fehr, W. Reiners, L.J. Balk, E. Kubalek, D. Köther, I. Wolff:
      "A 100-Femtosecond Electron Beam Blanking System"
      Microelectronic Engineering 12 (1990) 221-226
 
    • W. Reiners:
      "Fundamentals of Electron Beam Testing via Capacitive Coupling Voltage Contrast"
      Microelectronic Engineering 12 (1990) 325-340
 
    • M. Batinic, S. Görlich, K.D. Herrmann:
      "On geometrical dependencies of capacitive coupling voltage contrast& quot;
      Microelectronic Engineering 12 (1990) 341-348
 
    • W. Mertin:
      "Tagungsbericht 2nd European Conference on Electron and Optical Beam Testing of Integrated Circuits"
      Laser und Optoelektronik 22 (2) (1990) 42-44
 
    • L.J. Balk, M. Domnik, K. Niklas, P. Mestres:
      "Investigation of Human Tissues with Scanning Electron Acoustic Microscopy"
      Springer Series in Optical Sciences, Vol. 62 (1990) 428-430
 
    • M. Steck, H. Schewe, E. Kubalek:
      "Three-Dimensional Magnetic Field Measurement of a Modified Thin-Film Magnetic Head for Vertical Recording by Means of Lorentz-Tomography"
      IEEE Transactions on Magnetics, Vol. 26, No. 5 (1990) 1343-1345
 
    • F. Scheffer, M. Joseph, B. Roth, H. Lakner, I. Gyuro, M. Heuken, K. Heime:
      "Optimized layer structures for 3D integration of GaAs varactor and MESFET for a wide tuning range VCO"
      Inst. Phys. Conf. Ser. No. 112, Chapter 7 (1990) 509-514
 
    • C. Ballesteros, J. Piqueras, H. Lakner, B. Bollig, A. Ruiz, F. Briones:
      " STEM Characterization of Short-Period GaAs-GaP Strained Superlattices"
      Proc. of the XIIth Int. Congress for Electron Microscopy, San Francisco Press (1990) 596-597
 
    • M. Steck:
      "Magnetic Micro Structure Evaluation by means of Electron Beam Measuring Techniques"
      Proc. of the XIIth Int. Congress for Electron Microscopy, San Francisco Press (1990), 762-763
 
    • G.Bacher, J.Kovac, H.Schweizer, A.Forchel, H.Hillmer, H.Nickel, W.Schlapp, R.Lösch
      "High mobility excitonic transport in strained InxGa1-xAs/GaAs quantum wells"
      in Proceedings of the 20th International Conference on the Physics of Semiconductors,
      edited by E.M.Anastassakis and J.D.Joannopoulus (World Scientific, Singapore, 1990),
      Vol.2, pp. 937 - 940, (1990)

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                                                            | 94 | 93 | 92 | 91 | 90 | 89-85 | 84-80 | 79-75|
    • G. Koschek:
      "Ein Beitrag zur Mikroanalyse der Akzeptorzustände an den Korngrenzen in Bariumtitanatkeramiken"
      cfi/Ber. DKG 66 (1989) No. 1/2 13-17
       
 
    • L.J. Balk:
      "The Electron Acoustic Mode"
      SEM Microcharacterization of Semiconductors (1989) 426-445
 
    • H. Lakner, L.J. Balk, E. Kubalek:
      "A Parallel Detector for Electron-Energy Loss Spectroscopy (EELS) in a Field-Emission Scanning Transmission Electron Microscope (STEM)"
      Beitr. Elektronenmikroskop. Direktabb. Oberfl. 22 (1989) 241-248
 
    • D. Köhler, G. Koschek, E. Kubalek:
      "A Contribution To The Scanning Electron Microscope Based Microcharacterization Of Semi-Insulating Gallium Arsenide Substrates"
      Scanning Microscopy, Vol. 3, No. 3 (1989) 765-770
 
    • K. Kaufmann, L.J. Balk:
      "Untersuchung der Abhängigkeit von Elektronakustischen Kontrasten von dem Primärelektronenstrom und der Austastfrequenz an einem GaAs- MESFET"
      Fortschritte der Akustik - DAGA 89, Bad Honnef: DPG-GmbH (1989) 239-242
 
    • U.Cebulla, A.Forchel, G.Bacher, D.Grützmacher, W.T.Tsang, M.Razeghi
      "Barrier controlled hot carrier cooling in In0.53Ga0.47As/InP quantum wells"
      Solid State Electronics 32 (12), pp. 1669 -1673, (1989)
 
    • U.Cebulla, G.Bacher, A.Forchel, G.Mayer, W.T.Tsang
      "Excitonic lifetimes in thin InxGa1-xAs/InP quantum wells"
      Physical Review B 39 (9), pp. 6257 - 6260, (1989)
 
    • U.Cebulla, G.Bacher, A.Forchel, D.Schmitz, H.Jürgensen, M.Razeghi
      "Electron capture processes in optically excited In0.53Ga0.47As/InP quantum wells"
      Applied Physics Letters 55 (10), pp. 933 - 935, (1989)
 
    • U.Cebulla, A.Forchel, G.Bacher, D.Grützmacher, W.T.Tsang, M.Razeghi
      "Barrier-controlled thermalization in In0.53Ga0.47As/InP quantum wells"
      Physical Review B 40 (14), pp. 10009 - 10012, (1989)
 
    • U.Cebulla, G.Bacher, G.Mayer, A.Forchel, W.T.Tsang, M.Razeghi
      "Well width dependence of the carrier life time in InGaAs/InP quantum wells"
      Superlattices and Microstructures 5 (2), pp. 227 - 230, (1989)
 
    • M. Domnik, M. Schöttler, L.J. Balk:
      "Detector Strategy for Highly Versatile Scanning Electron Acoustic Microscopy (SEAM)"
      Springer Series in Optical Sciences 58 (1988) 292-293
 
    • N. Kultscher, K. Steiner, L.J. Balk:
      "Transducer-Less SEAM of III-V Compound Semiconductors"
      Springer Series in Optical Sciences 58 (1988) 237-240
 
    • W. Reiners, K.D. Herrmann, E. Kubalek:
      "Electron Beam Testing of Passivated Devices via Capacitive Coupling Voltage Contrast"
      SEM II (1988) 161-175
 
    • G. Koschek, H. Lakner, E. Kubalek:
      "On the Origin of Cathodoluminescence Contrast Phenomena in Semiinsulating GaAs"
      Phys. stat. sol. (a) 106 (1988) 651-658
 
    • L.J. Balk:
      "Scanning Electron Acoustic Microscopy"
      Advances in Electronics and Electron Physics 71 (1988) 1-73
 
    • L.J. Balk, M. Domnik, M. Schöttler:
      "Novel techniques in scanning electron acoustic microscopy (SEAM)" ;
      Inst. Phys. Conf. Ser. No. 93 (1988) 219-224
 
    • M. Steck, K.D. Herrmann, E. Kubalek:
      "Electron-Beam Test on Power Semiconductor Devices"
      Scanning 10 (1988) 147-152
 
    • G. Koschek, D. Köhler:
      "Die Kathodolumineszenz-Meßtechnik und ihre Möglichkeiten bei der Material-Mikrocharakterisierung"
      BEDO 21 (1988) 203-218
 
    • G. Koschek, H. Lakner, E. Kubalek:
      "On the Improvement of the Semiinsulating GaAs Substrate Homogeneity Due to Annealing"
      Phys. stat. sol. (a) 108 (1988) 683-688
 
    • D. Köhler, G. Koschek, E. Kubalek:
      "Vacancy Diffusion Profiles at the Grain Boundaries of Electronic Ceramics"
      Phys.stat.sol. (a) 105 (1988) 377-385
 
    • K. Kaufmann, L.J. Balk:
      "Application of Scanning Electron Acoustic Microscopy (SEAM) to Gallium Arsenide Technology"
      International School of Physical Acoustics, Third Course on Ultrasonic Signal Processing (1988) 403-411
 
    • D. Köhler, E. Kubalek:
      "Spatially Resolved Cathodoluminescence Investigations on Zinc Oxide Ceramics"
      Phys. stat. sol. (a) 100, (1987) 337-342
 
    • G. Koschek, E.Kubalek:
      "Rasterelektronenmikroskopische Direktabbildung von ferroelektrischen Domänen in BaTiO3-Keramiken durch Sekundärelektronen und Kathodolumineszenz"
      Phys. stat. sol. (a) 100, (1987) 355-368
 
    • J.B. Elsbrock, N. Nöthen, L.J. Balk, E. Kubalek:
      "Evaluation of dynamic magnetic stray fields with high spatial and temporal resolution"
      J. Appl. Phys. 61 (8) (1987) 4185-4187
 
    • G. Koschek, E. Kubalek:
      "Ein Beitrag zur Abbildbarkeit von ferroelektrischen Domänen durch Sekundärelektronen im Rasterelektronenmikroskop"
      BEDO 20 (1987) 111-121
 
    • K.D. Herrmann, W. Mertin, E. Kubalek:
      "Elektronenstrahl-Testen von höchstinte-grierten mikroelektronischen Bausteinen mit Mehrlagenverdrahtung"
      BEDO 20 (1987) 99-110
 
    • G. Koschek, E. Kubalek:
      "On the Electronic Structure and the Local Distribution of the Second Phase Ba6Ti17O40 in BaTiO3 Ceramics"
      Phys. stat. sol. (a) 102 (1987) 417-424
 
    • G. Koschek, D. Köhler, E. Kubalek:
      "Capabilities of the Cathodoluminescence Measurement Technique for the Micro-Analysis of Electronic Ceramics"
      High Tech Ceramics, ed. P. Vincenzini Publishers B.V. Amsterdam, Elsevier Science (1987) 1591-1600
 
    • L.J. Balk:
      "Akustische Rastermikroskopie als Methode zur Oberflä chenuntersuchung"
      Fresenius Z Anal Chem 329 (1987) 159-164
 
    • L.J. Balk, N. Kultscher:
      "Application of scanning electron acoustic microscopy (SEAM) to the characterization of semiconducting materials and devices"
      Inst. Phys. Conf. Ser. No. 87: Section 11 (1987) 675-684
 
    • L.J. Balk, M. Domnik, E. Böhm:
      "Application of scanning electron acoustic microscopy for medical research"
      SPIE-Proceedings 809 (1987) 151-157
 
    • K.D. Herrmann, E. Kubalek:
      "Design for e-beam testability - A demand for e-beam testing of future device generations?"
      Microelectronic Engineering 7 (1987) 405-415
 
    • D. Deutges, S. Görlich, E. Kubalek:
      "Computer Simulation and Experimental Performance Data for an Electron Spectrometer for Electron Beam Testing of Integrated Circuits"
      SEM I (1986), 45-56
 
    • N. Kultscher, L.J. Balk:
      "Signal Generation and Contrast Mechanisms in Scanning Electron Acoustic Microscopy"
      SEM I (1986), 33-43
 
    • S. Görlich, K.D. Herrmann, W. Reiners, E. Kubalek:
      "Capacitive Coupling Voltage Contrast"
      SEM II (1986), 447-464
 
    • L.J. Balk:
      "Scanning Acoustic Microscopy"
      Surface and Interface Analysis, 9, (1986), 47-54
 
    • G. Koschek, E. Kubalek:
      "A Contribution to the Cathodoluminescence Analysis of Commercial BaTiO3 Ceramic Devices"
      Ferroelectrics, 68, (1986) 293-303
 
    • K. Löhnert, W. Wettling, G. Koschek:
      "Effects of Ingot and Wafer Annealing on the Properties of Undoped Semi-Insulating GaAs"
      Semi-Insulating III-V Materials, Ohmsha, Ltd. (1986), 267-272
 
    • L.J. Balk:
      "Thermal- and acoustic-wave techniques in scanning electron microscopy "
      Canadian Journal of Physics, 64, Nr. 9 (1986), 1238-1246
 
    • K.D. Herrmann, E. Kubalek:
      "Some Aspects Concerning Design for E-Beam Testability"
      Microelectronic Engineering 5 (1986) 515-522
 
    • J. Piqueras, E. Kubalek:
      "Cathodoluminescence from Deformed ZnO Ceramics"
      Solid State Commun. 54, No. 8 (1985) 745-746
 
    • S. Görlich, E. Kubalek:
      "Electron Beam Induced Damage on Passivated Metal Oxide Semiconductor Devices"
      SEM I (1985) 87-95
 
    • W. Reiners, S. Görlich, E. Kubalek:
      "On the primary electron energy dependence of radiation damage in passivated NMOS transistors"
      Inst. Phys. Conf. Ser., No. 76 (1985) 507-512
 
    • L.J. Balk, G. Richard, N. Kultscher:
      "Semiconductor characterization by simultaneous evaluation of electron beam induced current and scanning electron acoustic microscopy in an automated scanning electron microscope"
      Inst. Phys. Conf., Ser. No. 76 (1985) 343-348
 
    • G. Koschek, E. Kubalek:
      "Application of a New Detector for Cathodoluminescence Measurements in the Wavelength Range to 1.8*10-6m",
      Scanning 7 (1985) 199-204
 
    • J.B. Elsbrock, W. Schroeder, E. Kubalek:
      "Evaluation of Three-Dimensional Micromagnetic Stray Fields by Means of Electron-Beam Tomography"
      IEEE Trans. Magn., MAG-21, No. 5, (1985) 1593-1595
 
    • J. Piqueras, E. Kubalek:
      "Cathodoluminescence from Electron-Irradiated ZnO"
      Phys. stat. sol. (a) 91, (1985) 569-572
 
    • G. Koschek, E. Kubalek:
      "Grain-Boundary Characteristics and Their Influence on the Electrical Resistance of Barium Titanate Ceramics"
      J. Am. Ceram. Soc. 68 (11) (1985) 582-586

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                                                                | 94 | 93 | 92 | 91 | 90 | 89-85 | 84-80 | 79-75|

 

    • A. Bernds, K. Löhnert, E. Kubalek:
      "SEM EBIC Investigations of ZnO Varistor Ceramics"
      Journal de Physique, Coll. C2, No. 2, 45, (1984) C2-861 bis C2-864
 
    • L.J. Balk, N. Kultscher:
      "Nonlinear Scanning Electron Acoustic Microscopy"
      Journal de Physique, Coll. C2, No. 2, 45, (1984) C2-869 bis C2-872
 
    • L.J. Balk, N. Kultscher:
      "Scanning Electron Acoustic Microscopy with Subnanosecond Time Resolution"
      Journal de Physique, Coll. C2, No. 2, 45, (1984) C2-873 bis C2-876
 
    • L.J. Balk, D.G. Davies, N. Kultscher:
      "The Dependence of Scanning Electron Acoustic Microscopy (SEAM) Imaging on Chopping and Detection Frequency for Metal Samples"
      Phys. stat. sol. (a) 82 (1984) 23-33
 
    • K. Löhnert, E. Kubalek:
      "The Cathodoluminescence Contrast Formation of Localized Non-Radiative Defects in Semiconductors"
      Phys. stat. sol. (a) 83 (1984) 307-314
 
    • J. Elsbrock, L.J. Balk:
      "Quantitative Evaluation of Micromagnetic Fields by Means of a Scanning Electron Microscope"
      SEM I (1984) 131-139
 
    • L.J. Balk, J.B. Elsbrock:
      "Investigation of Magnetic Structures with the Scanning Electron Microscope"
      SEM I (1984) 141-149
 
    • K.D. Herrmann, J.B. Elsbrock. E. Kubalek:
      "Simulation des Einflusses mikromagne-tischer Streufelder auf den Elektronenstrahl im Rasterelektronenmikroskop"
      BEDO 17 (1984) 1-10
 
    • S. Görlich, E. Kubalek:
      "Praktischer Einsatz des Elektronenstrahl-Testverfahrens in LSI- und VLSI-Bausteinen"
      BMFT-Forschungsbericht T 84-185, Sept. 1984
 
    • J.B. Elsbrock, L.J. Balk:
      "Profiling of Micromagnetic Stray Fields in Front of Magnetic Recording Media and Heads by Means of a SEM"
      IEEE Trans. Magn. MAG-20, 5 (1984) 866-868
 
    • L.J. Balk, D.G. Davies, N. Kultscher:
      "Investigation of Si - Fe Transformer Sheets by Scanning Electron Acoustic Microscopy (SEAM)"
      IEEE Trans. Magn. MAG-20, 5 (1984) 1466-1468
 
    • D. Deutges, S. Görlich, E. Kubalek:
      "Computer Simulated and Experimentally Evaluated Performances of a New SE-Spectrometer for E-Beam Testing"
      Proc. 8th European Congress on Electron Microscopy
      Budapest, 1 (1984) 93
 
    • L.J. Balk, D.G. Davies, N. Kultscher:
      "Scanning Electron Acoustic Microscopy in the Nonlinear Imaging Mode"
      Proc. 8th European Congress on Electron Microscopy, Budapest, 1 (1984) 655-656
 
    • L.J. Balk, D.G. Davies, N. Kultscher:
      "Application of Nonlinear Scanning Electron Acoustic Microscopy in Metals Research"
      SEM IV (1984) 1601-1610
 
    • S. Görlich, K.D. Herrmann, E. Kubalek:
      "Basic Investigations of Capacitive Coupling Voltage Contrast"
      Microcircuit Engineering (1984) 451-460
 
    • E. Menzel, E. Kubalek:
      "Fundamentals of Electron Beam Testing of Integrated Circuits"
      Scanning 5 No. 3 (1983) 103-122
 
    • E. Menzel, E. Kubalek:
      "Secondary Electron Detection Systems for Quantitative Voltage Measurements"
      Scanning 5 No. 4 (1983) 151-171
 
    • M. Ostrow, E. Postulka, E. Menzel, E. Kubalek:
      "Multichannel logic state analysis of IC-internal signals by an electron-beam probe"
      Inst. Phys. Conf. Ser. No. 67 (1983) 421-426
 
    • L.J. Balk, N. Kultscher:
      "Techniques for scanning electron acoustic microscopy"
      Inst. Phys. Conf. Ser. No. 67 (1983) 387-392
 
    • K. Löhnert, E. Kubalek:
      "Characterisation of semiconducting materials and devices by EBIC and CL techniques"
      Inst. Phys. Conf. Ser. No. 67, (1983) 303-314
 
    • D. Deutges, E. Kubalek:
      "Computer Aided Optimization of Electron-Spectrometer-Detector Design in Electron-Beam Testing Systems for Integrated Circuits"
      BEDO 16 (1983) 47-56
 
    • G. Koschek, E. Kubalek:
      "Microanalytical Investigations of Second Phases in Bariumtitanate Ceramics"
      BEDO 16 (1983) 19-27
 
    • J.B. Elsbrock, L.J. Balk:
      "Quantitative Determination of Magnetic Stray Fields Above Magnetic Recording Heads"
      BEDO 16 (1983) 199-206
 
    • L.J. Balk, N. Kultscher:
      "Scanning Electron Acoustic Microscopy"
      BEDO 16 (1983) 107-120
 
    • K. Löhnert, E. Kubalek:
      "Cathodoluminescence microanalysis of semiconductors - potential and limits"
      Proc. 41st Annual Meeting of the Electron Microscopy Society of America, Herausgeber G.W. Bailey, San Francisco Press (1983) 138-141
 
    • G. Koschek, E. Kubalek:
      "Micron-scaled spectral-resolved cathodoluminescence of grains in bariumtitanate ceramics"
      Phys. stat. sol. (a) 79, (1983) 131-139
 
    • K. Löhnert, E. Kubalek:
      "On the Degradation of Electroluminescence Efficiency in Gallium Phosphide Green Light Emitting Diodes"
      Phys. stat. sol. (a) 80, (1983) 173-183
 
    • S. Görlich, E. Postulka, E. Kubalek:
      "Window Scan Mode for Testing Passivated MOS-Devices"
      Microcircuit Engineering (1983) 494-500
 
    • L.J. Balk, N. Kultscher:
      "Materialprüfung mit der Elektronakustischen Rastermikroskopie& quot;
      Berichtsband des DVM 1983, 39-42
 
    • N. Kultscher, L.J. Balk:
      "Akustische Rastermikroskopie - Ein Vergleich unterschiedlicher Verfahren"
      Berichtsband des DVM 1983, 31-37
 
    • S. Görlich, E. Kubalek:
      "Irradiation effects on passivated NMOS-transistors caused by electron beam testing"
      Microelectronic Engineering 1 (1983) 93-102
 
    • M. Ostrow, E. Menzel, E. Postulka, S. Görlich, E. Kubalek:
      "IC-Internal Electron Beam Logic State Analysis"
      SEM (1982) 563-572
 
    • S. Görlich, E. Menzel, E.Kubalek:
      "Kapazitiver Potentialkontrast"
      BEDO 15 (1982) 133-142
 
    • J.B. Elsbrock, L.J. Balk:
      "Untersuchung uniaxialer magnetischer Oberflächenstreufelder im Rasterelektronenmikroskop"
      BEDO 15 (1982) 17-26
 
    • E. Kubalek, E. Menzel:
      "Electron Beam Microcircuit Inspection Technique"
      Methods and Materials in Microelectronic Technology, IBM Research Symposia Series, (1982) Plenum Press, New York, 337-356
 
    • K. Löhnert, E. Kubalek:
      "Theoretical Evaluation of the Cathodoluminescence (CL) Intensity Distribution around Semiconductor Defects"
      Proc. of the 10th Intern. Congr. on Electron Microscopy, Hamburg, 2 (1982) 419-420
 
    • L.J. Balk, J.B. Elsbrock:
      "A Two-Dimensional Spatially Resolving Electron Detection System" ;
      Congress Proc. of the 10th Intern. Congr. on Electron Microscopy, Hamburg, 1 (1982) 447-448
 
    • M. Hastenrath, E. Kubalek:
      "Time-Resolved Cathodoluminescence in Scanning Electron Microscopy& quot;
      SEM I (1982) 157-173
 
    • K. Löhnert. E. Kubalek:
      "Cathodoluminescence Investigations of the Grain Structure of Zinc Oxide Ceramic"
      BEDO 14 (1981) 147-152
 
    • M. Hastenrath, K. Löhnert, E. Kubalek:
      "Simultaneous detection techniques and computer-controlled data acquisition for spectrally and time resolved cathodoluminescence in the SEM"
      Inst. Phys. Conf. Ser. No. 61 (1981) 47-50
 
    • K. Löhnert, M. Hastenrath, L.J. Balk, E. Kubalek:
      "A scanning electron microscope based cathodoluminescence measurement system - instrumentation and capabilities"
      Inst. Phys. Conf. Ser. No. 60 (1981) 179-184
 
    • E. Menzel, E. Kubalek:
      "Electron Beam Test Techniques for Integrated Circuits"
      SEM (1981) 305-322
 
    • E. Kubalek, L.J. Balk:
      "Rastermikroskopie in der Materialprüfung"
      DVM-Arbeitskreis Rastermikroskopie, Dortmund (1981) 9-19
 
    • M. Ostrow, E. Menzel, E. Kubalek:
      "Real Time Logic State Analysis of IC-Internal Signals with an Electron Beam Probe Logic State Analyzer Combination"
      Microcircuit Engineering (1981) 514-521
 
    • E. Kubalek, E. Menzel:
      "Microcircuit Inspection Techniques using an Electron Beam Probe" ;
      Microcircuit Engineering (1981) 495-506
 
    • E. Menzel:
      "Funktionskontrolle und Fehleranalyse hochintegrierter Schaltkreise durch lokale quantitative Bestimmung bauelementinterner Signalverläufe& quot;
      BMFT-Forschungsbericht T 81-201, Nov. 1981
 
    • L.J. Balk, E. Menzel, E. Kubalek:
      "Microcharacterization of Semiconductors by Cathodoluminescence (CL) and Electron Beam Induced Current (EBIC) Techniques"
      Proc. 8th International Conference on X-Ray Optics and Microanalysis (1980) 613-624
 
    • L.J. Balk, M. Hastenrath, K. Löhnert, E. Kubalek:
      "Cathodoluminescence Instrumentation for Quality Control of Optoelectronic Materials and Devices"
      Journal Radioelectronics Abroad UDSSR 8 (1980) 44-51
 
    • G. Pfefferkorn, W. Bröcker, M. Hastenrath:
      "The Cathodoluminescence Method in the Scanning Electron Microscope& quot;
      Scanning Electron Microscopy (1980) I, 250-258

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                                                              | 94 | 93 | 92 | 91 | 90 | 89-85 | 84-80 | 79-75 |

 

    • U. König, K. Heime, E. Kubalek:
      "The Influence of the Growth Process on Doping Profile and Mobility Profile During LPE of the Pseudobinary Sn-GaAs System"
      J. Electrochemical Society 126, No. 2 (1979) 296-299
 
    • E. Menzel, E. Kubalek:
      "Electron Beam Chopping Systems in the SEM"
      SEM I (1979) 305-318
 
    • E. Menzel, E. Kubalek:
      "Electron Beam Test System for VLSI Circuit Inspection"
      SEM I (1979) 297-304
 
    • K. Löhnert, M. Hastenrath, E. Kubalek:
      "Spatially Resolved Cathodoluminescence Studies of GaP LED's in the Scanning Electron Microscope Using Optical Multichannel Analysis"
      SEM I (1979) 229-236
 
    • E. Menzel, E. Kubalek:
      "Messung interner Signalverläufe an Leiterbahnen in hö chstintegrierten Schaltkreisen mit Hilfe einer Elektronensonde"
      NTG-Fachberichte (1979) 145-148
 
    • M. Hastenrath, L.J. Balk, K. Löhnert, E. Kubalek:
      "Time resolved cathodoluminescence in the scanning electron microscope by use of the streak technique"
      J. Microscopy, 118, Pt 3 (1979) 303-308
 
    • M. Hastenrath, K. Löhnert, E. Kubalek:
      "Zeitaufgelöste Kathodolumineszenz im Rasterelektronenmikroskop mit Hilfe einer Streak Kamera"
      BEDO 12/1 (1979) 163-176
 
    • H.P. Feuerbaum, D. Kantz, E. Wolfgang, E. Kubalek:
      "Quantitative Measurement with High Time Resolution of Internal Waveforms on MOS RAM´s Using a Modified Scanning Electron Microscope& quot;
      Digest of Technic. Papers ESSCIRC (1977) 139-140, IEEE Journal of Solid State Circuits, SC-13, No. 3 (1978) 319-325
 
    • E. Menzel, E. Kubalek:
      "Elektronenstrahlaustastsysteme"
      BEDO 11 (1978) 47-66
 
    • L.J. Balk, E. Menzel, E. Kubalek:
      "Ultrahochvakuum-Probenkammern zum Rasterelektronenmikroskop"
      BEDO 11 (1978) 105-112
 
    • K. Löhnert, M. Hastenrath, L. Balk, E. Kubalek:
      "Optische Vielkanalanalyse der Kathodolumineszenz im Rasterelektronenmikroskop"
      BEDO 11 (1978) 95-104
 
    • B. Höfflinger, H. Sibbert, G. Zimmer, E. Kubalek, E. Menzel:
      "Model and Performance of Hot-Electron MOS Transistors for High-Speed, Low-Power LSI"
      IEDM Technical Digest (1978) 463-46
 
    • L.J. Balk, E. Kubalek:
      "Micron Scaled Cathodoluminescence of Semiconductors"
      IITRI/SEM (1977) 739-746
 
    • M. Hastenrath, H.E. Krüger, E. Kubalek:
      "High-temperature x-ray topography system for the investigation of semiconductor single crystals"
      Rev. Sci. Instrum. 48, No. 6 (1977) 605-609
 
    • L.J. Balk, H.P. Feuerbaum, E. Kubalek, E. Menzel:
      "Quantitative Voltage Contrast at High Frequencies in the SEM"
      IITRI/SEM (1976) 615-624
 
    • L.J. Balk, E. Kubalek, E.Menzel:
      "Investigations of As-Grown Dislocations in GaAs Single Crystals in the SEM"
      IITRI (1976) 257-264
 
    • U. König, U. Langmann, K. Heime, L.J. Balk, E. Kubalek:
      "Orientation Dependent Growth and Luminescence of Selective GaAs-Sn LPE"
      J. Cryst. Growth 36 (1976) 165-170
 
    • E. Kubalek:
      "Methoden zur Mikrocharakterisierung von Halbleiter-Werkstoffen und Bauelementen im Rasterelektronenmikroskop"
      BEDO 9 (1976) 185-204
 
    • L.J. Balk, E. Kubalek, E. Menzel:
      "Microcharacterization of Electroluminescent Diodes with the Scanning Electron Microscope (SEM)"
      IEEE Trans. on Electron Devices, Vol. ED-22 No. 9 (1975) 707-712
 
    • L.J. Balk, E. Kubalek, E. Menzel:
      "Time-Resolved and Temperature Dependent Measurements of Electron Beam Induced Current (EBIC), Voltage (EBIV) and Cathodoluminescence (CL) in the SEM"
      ++ IITRI/SEM I (1975) 447-456
 
    • L.J. Balk, K. Elbern, E. Kubalek:
      "Elektronische Zusätze zum Rasterelektronen-mikroskop"
      BEDO 8 (1975) 313-323
 
    • L.J. Balk, H.P. Feuerbaum, E. Kubalek, E. Menzel:
      "Stroboscopic Investigation of Integrated Circuits in the SEM"
      BEDO 8 (1975) 461-468
 
    • L.J. Balk, H.E. Krüger, E. Kubalek, E. Menzel:
      "Analysis of Crystal Defects in GaAs by Use of X-Ray Topography and Scanning Electron Microscopy"
      BEDO 8 (1975) 495-507
 
    • E. Kubalek, G. Pirug:
      "Detection of Preparation Dependent Surface Damage on Silicon-Single- Crystals by Electron-Channelling-Patterns (ECP)-Techniques"
      BEDO 8 (1975) 451-460
      + IITRI/SEM: Proceedings of the Eighth Annual Scanning Electron Microscope Symposium, IIT Research Institute, Chicago, IL , U.S.A.
 
    • H.P. Feuerbaum, E. Kubalek:
      "Qualitative and Quantitative Voltage Measurement on Integrated Circuits"
      BEDO 8 (1975) 469-480
 
    • L.J. Balk, H.P. Feuerbaum, E. Kubalek, E. Menzel:
      "Quantitative Determination of Surface Potentials on Integrated Circuits (IC) at High Frequencies with the Scanning Electron Microscope (SEM)"
      Techn. Digest IEEE International Electron Devices Meeting (1975), 115-118< BR>
 
  • E. Kubalek:
    "Entmischungsvorgänge nach dem Nitrieren"
    Härterei-Technische Mitteilungen 30 (1975) Heft 5, 283-287

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