Staff

Prof. i.R. Dieter Mergel

Room
MC 385
Phone
+49 203 379 2190/2335
Fax
+49 203 379 46 06
E-Mail
dieter.mergel@uni-due.de

Functions

  • Professor/in, Technische Physik

The following publications are listed in the online university bibliography of the University of Duisburg-Essen. Further information may also be found on the person's personal web pages.

    Journal articles

  • Schipporeit, Sebastian; Jerman, Martin; Mergel, Dieter
    Crystallization and conductivity of large-domain Nb-doped TiO₂ films prepared by electron beam evaporation
    In: Thin Solid Films Vol. 754 (2022) 139299
    Online Full Text: dx.doi.org/
  • Dorow-Gerspach, Daniel; Mergel, Dieter; Wuttig, Matthias
    Effects of different amounts of nb doping on electrical, optical and structural properties in sputtered tio₂−ₓ films
    In: Crystals Vol. 11 (2021) Nr. 3, 301
    Online Full Text: dx.doi.org/ (Open Access)
  • Doyle, T.B.; Mergel, Dieter; Schröter, W.; Wagner, R.;
    Line defects in crystals and flux pinning in superconductors Scientific work of Reiner Labusch (1935 - 2016)
    18th International Conference on Extended Defects in Semiconductors, EDS 2016, 25-29 September 2016, Saint Aygulf, France,
    In: Materials Today: Proceedings Vol. 5 (2018) Nr. 6, pp. 14662 - 14692
    Online Full Text: dx.doi.org/
  • Schipporeit, Sebastian; Mergel, Dieter
    Spectral decomposition of Raman spectra of mixed-phase TiO₂ thin films on Si and silicate substrates
    In: Journal of Raman Spectroscopy Vol. 49 (2018) Nr. 7, pp. 1217 - 1229
    Online Full Text: dx.doi.org/
  • Mukherjee, Sanat Kumar; Nebatti, Abdelkader; Mohtascham, F.; Schipporeit, Sebastian; Notthoff, C.; Mergel, Dieter
    Influence of thickness on the structural properties of radio-frequency and direct-current magnetron sputtered TiO2 anatase thin films
    In: Thin Solid Films Vol. 558 (2014) pp. 443 - 448
    Online Full Text: dx.doi.org/
  • Mukherjee, Sugata K.; Becker, Hans Werner; Cadiz Bedini, Andrew P.; Nebatti, Abdelkader; Notthoff, Christian; Rogalla, Detlef; Schipporeit, Sebastian; Soleimani-Esfahani, A.; Mergel, Dieter
    Structural and electrical properties of Nb-doped TiO₂ films sputtered with plasma emission control
    In: Thin Solid Films Vol. 568 (2014) Nr. 1, pp. 94 - 101
    Online Full Text: dx.doi.org/
  • Mukherjee, Sugata K.; Mergel, Dieter
    Thickness dependence of the growth of magnetron-sputtered TiO₂ films studied by Raman and optical transmittance spectroscopy
    In: Journal of Applied Physics Vol. 114 (2013) Nr. 1,
    Online Full Text: dx.doi.org/
  • Piegdon, Karoline; Lexow, Matthias Michael; Grundmeier, Guido; Kitzerow, Heinz Siegfried R.; Pärschke, Klaus; Mergel, Dieter; Reuter, Dirk; Wieck, Andreas Dirk; Meier, Cedrik
    All-optical tunability of microdisk lasers via photo-adressable polyelectrolyte functionalization
    In: Optics Express Vol. 20 (2012) Nr. 6, pp. 6060 - 6067
    Online Full Text: dx.doi.org/ (Open Access)
  • Mergel, Dieter
    Keimbildung und Wachstum von TiO2 in dünnen Schichten : Bombardierung erzeugt Rutil-Keime; bei 250°C entstehen große Anatas-Körner
    In: Vakuum in Forschung und Praxis: Zeitschrift für Vakuumtechnologie, Oberflächen und Dünne Schichten Vol. 23 (2011) Nr. 1, pp. 20 - 23
    Online Full Text: dx.doi.org/
  • Mergel, Dieter; Jerman, Martin
    Density and refractive index of thin evaporated films
    In: Chinese Optics Letters Vol. 8 (2010) Nr. Suppl., pp. 67 - 72
    Online Full Text: dx.doi.org/
  • Qiao, Zhaohui; Mergel, Dieter
    Dielectric modeling of transmittance and ellipsometric spectra of thin In ₂O ₃ : Sn films
    In: Physica Status Solidi (A) Applications and Materials Science Vol. 207 (2010) Nr. 7, pp. 1543 - 1548
    Online Full Text: dx.doi.org/
  • Jerman, Martin; Mergel, Dieter
    Post-heatig of SiO2 films for optical coatings
    In: Thin Solid Films Vol. 516 (2008) Nr. 23, pp. 8749 - 8751
    Online Full Text: dx.doi.org/
  • Davies, Patrick Laurie; Gather, U.; Meise, Monika; Mergel, Dieter; Mildenberger, T.
    Residual Based Localisation and Quantification of Peaks in X-Ray Diffractograms.
    In: Annals of Applied Statistics, 2 (2008) pp. 861 - 886
  • Reddy, Kesava Y.K.V.; Mergel, Dieter
    Frequency and temperature-dependent dielectric properties of BaTiO3 thin film capacitors studied by complex impedance spectroscopy
    In: Physica B: Condensed Matter Vol. 391 (2007) Nr. 2, pp. 212 - 221
    Online Full Text
  • Jerman, Martin; Mergel, Dieter
    Structural investigation of thin TiO2 films prepared by evaporation and post-heating
    In: Thin Solid Films Vol. 515 (2007) Nr. 17, pp. 6904 - 6908
    Online Full Text: dx.doi.org/
  • Reddy, Kesava Y.K.V.; Mergel, Dieter
    Impedance spectroscopy study of RuO2/SrTiO3 thin film capacitors prepared by radio-frequency magnetron sputtering
    In: Materials Science and Engineering: B Vol. 130 (2006) Nr. 1-3, pp. 237 - 245
    Online Full Text
  • Reddy, Kesava Y.K.V.; Mergel, Dieter
    Structural and electrical properties of RuO2 thin films prepared by rf-magnetron sputtering and annealing at different temperatures
    In: Journal of Materials Science: Materials in Electronics Vol. 17 (2006) Nr. 12, pp. 1029 - 1034
    Online Full Text
  • Reddy, Kesava Y.K.V.; Mergel, D.; Reuter, S.; Buck, Volker; Sulkowski, Martin
    Structural and optical properties of BaTiO3 thin films prepared by radio-frequency magnetron sputtering at various substrate temperatures
    In: Journal of Physics D: Applied Physics Vol. 39 (2006) Nr. 6, pp. 1161 - 1168
    Online Full Text: dx.doi.org/
  • Jerman, Martin; Qiao, Zhaohui; Mergel, Dieter
    Refractive index of thin films of SiO2, ZrO2, and HfO2 as a function of the films' mass density
    In: Applied Optics Vol. 44 (2005) Nr. 15, pp. 3006 - 3012
  • Mergel, Dieter; Schenkel, M.; Ghebre, M.; Sulkowski, Margareta
    Structural and electrical properties of In2O3 : Sn films prepared by radio-frequency sputtering
    In: Thin Solid Films Vol. 392 (2001) Nr. 1, pp. 91 - 97
    Online Full Text: dx.doi.org/

    • Books, Collections, Proceedings

  • Mergel, Dieter
    Physics with Excel and Python : Using the Same Data Structure ; Volume I: Basics, Exercises and Tasks
    Cham (2023) XVII, 482 Seiten
    Online Full Text: dx.doi.org/