Publikationen

2024
 

  • Pfnür, Herbert; Tegenkamp, Christoph; Sanna, Simone; Jeckelmann, Eric; Horn-von Hoegen, Michael; Bovensiepen, Uwe; Esser, Norbert; Schmidt, Wolf G.; Dähne, Mario; Wippermann, Stefan; Bechstedt, Friedhelm; Bode, Matthias; Claessen, Ralph; Ernstorfer, Ralph; Hogan, Conor; Ligges, Manuel; Pucci, Annemarie; Schäfer, Jörg; Speiser, Eugen; Wolf, Martin; Wollschläger, Joachim
    Atomic Wires on Substrates: Physics between One and Two Dimensions
    Surf. Sci. Reports 79, 100629 (2024)
    DOI: 10.1016/j.surfrep.2024.100629

  • Brand, Christian; Hucht, Alfred; Mehdipour, Hamid; Jnawali, Giriraj; Fortmann, Jonas D.; Tajik, Mohammad; Hild, Rüdiger; Sothmann, Björn; Kratzer, Peter; Schützhold, Ralf; Horn-von Hoegen, Michael;
    Critical Behavior of the Dimerized Si(001) Surface: Continuous Order-Disorder Phase Transition in the 2D Ising Universality Class
    Phys. Rev. B 109, 134104 (2024)
    DOI: 10.1103/PhysRevB.109.134104

  • Horn-von Hoegen, Michael
    Structural Dynamics at Surfaces by Ultrafast Reflection High Energy Electron Diffraction
    Struct. Dyn. 11, 021301 (2024)
    DOI:10.1063/4.0000234

  • Dreher, Pascal; Janoschka, David; Giessen, Harald; Schützhold, Ralf; Davis, Timothy J.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank-J.
    Momentum Space Separation of Quantum Path Interferences between Photons and Surface Plasmon Polaritons in Nonlinear Photoemission Microscopy
    Nanophotonics (2024)
    DOI: 10.1515/nanoph-2023-0776

  • F. Thiemann, G. Sciaini, A. Kassen, T. S. Lott, and M. Horn-von Hoegen
    Disentangling the Electronic and Lattice Contributions to the Dielectric Response of Photoexcited Bismuth
    Phys. Rev. B 109, L041105 (2024)
    DOI: 10.1103/PhysRevB.109.L041105

  • Lu, Wei; Nicoul, Matthieu; Shymanovich, Uladzimir; Tarasevitch, Alexander; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus
    A Modular Table-Top Setup for Ultrafast X-Ray Diffraction
    Rev. Sci. Instrum. 95, 013002 (2024)
    DOI: 10.1063/5.0181132

2023
 

  • Tajik, Mohammad; Witte, Tobias; Brand, Christian; Rettig, Laurenz; Sothmann, Björn; Bovensiepen, Uwe; Horn-von Hoegen, Michael
    Electron Phonon Coupling in Ultrathin Pb Films on Si(111): Where the Heck is the Energy?
    arXiv: Mesoscale and Nanoscale Physics submitted on 7 Dec 2023
    DOI: 10.48550/arXiv.2312.04541

  • D. Fortmann, Jonas; Brand, Christian; Horn-von Hoegen, Michael
    Cool Cooling Collar for Bake-Out of Temperature-Sensitive Devices
    arXiv: Instrumentation and Detectors submitted on 16 Nov 2023
    DOI: 10.48550/arXiv.2311.10010

  • Schaller, Gernot; Queisser, Friedemann; Katoorani, Seyedeh Parya; Brand, Christian; Kohlfürst, Christian; Freeman, Mark R.; Hucht, Alfred; Kratzer, Peter; Sothmann, Björn; Horn-von Hoegen, Michael; Schützhold, Ralf
    Sequential Kibble-Zurek Dynamics in the Anisotropic Ising Model of the Si(001) Surface
    arXiv: Statistical Mechanics submitted on 27 Oct 2023
    DOI: 10.48550/arXiv.2310.18216

  • Brand, Christian; Tinnemann, Verena; Hanisch-Blicharski, Anja; Tajik, Mohammad; Fortmann, Jonas D.; Kaßen, Alexander; Thiemann, Fabian; Horn-von Hoegen, Michael
    Non-Equilibrium Pathways for Excitation of Bulk and Surface Phonons through Anharmonic Coupling
    arXiv: Mesoscale and Nanoscale Physics submitted on 24 Oct 2023
    DOI: 10.48550/arXiv.2310.15740

  • Bauer, Thomas; Davis, Timothy J.; Frank, Bettina; Dreher, Pascal; Janoschka, David; Meiler, Tim C.; Meyer zu Heringdorf, Frank-J.; Kuipers,L.; Giessen, Harald
    Ultrafast Time Dynamics of Plasmonic Fractional Orbital Angular Momentum
    ACS Photonics (2023)
    DOI: 10.1021/acsphotonics.3c01036

  • Brand, Christian; Hucht, Alfred; Jnawali, Giriraj; Fortmann, Jonas Darius; Sothmann, Björn; Mehdipour, Hamid; Kratzer, Peter; Schützhold, Ralf; Horn-von Hoegen, Michael
    Dimer Coupling Energies of the Si(001) Surface
    Phys. Rev. Lett. 130, 126203 (2023)
    DOI: 10.1103/PhysRevLett.130.126203

  • Neuhaus, Alexander; Dreher, Pascal; Schütz, Florian; Marchetto, Helder; Franz, Torsten; Meyer zu Heringdorf, Frank-J.
    Angle-Resolved Photoelectron Spectroscopy in a Low-Energy Electron Microscope
    Struct. Dyn. 10, 064304 (2023)
    DOI: 10.1063/4.0000216

  • Dreher, Pascal; Janoschka, David; Frank, Bettina; Giessen, Harald; Meyer zu Heringdorf, Frank-J.
    Focused Surface Plasmon Polaritons Coherently Couple to Electronic States in Above-Threshold Electron Emission
    Commun. Phys. 6, 15 (2023)
    DOI: 10.1038/s42005-023-01128-w

  • Kriegel, Marko A.; Omambac, Karim; Franzka, Steffen; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Incommensurability and Negative Thermal Expansion of Single Layer Hexagonal Boron Nitride
    Appl. Surf. Sci. 624, 157156 (2023)
    DOI: 10.1016/j.apsusc.2023.157156

  • Omambac, Karim; Kriegel, Marko A.; Petrović, Marin; Finke, Birk; Brand, Christian; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Interplay of Kinetic Limitations and Disintegration : Selective Growth of Hexagonal Boron Nitride and Borophene Monolayers on Metal Substrates
    ACS Nano 17, 17946 (2023)
    DOI: 10.1021/acsnano.3c04038

  • Koç, Azize; Gonzalez-Vallejo, Isabel; Runge, Matthias; Ghalgaoui, Ahmed; Reimann, Klaus; Kremeyer, Laurenz; Thiemann, Fabian; Horn-von Hoegen, Michael; Sokolowski-Tinten, Klaus; Woerner, Michael; Elsaesser, Thomas
    Quantum Pathways of Carrier and Coherent Phonon Excitation in Bismuth
    Phys. Rev. B 107, L180303 (2023)
    DOI: 10.1103/PhysRevB.107.L180303

  • Davis, Timothy J.; Meyer zu Heringdorf, Frank; Giessen, Harald
    Topology of Surface Plasmon Polaritons with Integer and Fractional Orbital Angular Momentum
    ACS Photonics in press (2023)
    DOI: 10.1021/acsphotonics.3c01024

  • Runge, Matthias; Ghalgaoui, Ahmed; Gonzalez-Vallejo, Isabel; Thiemann, Fabian; Horn-von Hoegen, Michael; Reimann, Klaus; Woerner, Michael; Elsaesser, Thomas
    Ultrafast Carrier Dynamics and Symmetry Reduction in Bismuth by Nonperturbative Optical Excitation in the Terahertz Range
    Phys. Rev. B 107, 245140 (2023)
    DOI: 10.1103/PhysRevB.107.245140

2022
 

  • Dreher, Pascal; Janoschka, David; Neuhaus, Alexander; Frank, Bettina; Giessen, Harald; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Quantitative Determination of the Electric Field Strength in a Plasmon Focus from Ponderomotive Energy Shifts
    Nanophotonics 11, 3687-3694 (2022)
    DOI: 10.1515/nanoph-2022-0284

  • Thiemann, Fabian; Sciaini, G.; Kassen, A.; Hagemann, Ulrich; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Ultrafast Transport-Mediated Homogenization of Photoexcited Electrons Governs the Softening of the A1g Phonon in Bismuth
    Phys. Rev. B 106, 014315 (2022)
    DOI: 10.1103/PhysRevB.106.014315

2021
 

  • Petrović, Marin; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael; Thiel, Patricia A.; Tringides, Michael C.
    Broad Background in Electron Diffraction of 2D Materials as a Signature of Their Superior Quality
    Nanotechnology 32, 505706 (2021)
    DOI: 10.1088/1361-6528/ac244f

  • Jnawali, Giriraj; Boschetto, Davide; Malard, Leandro M.; Heinz, Tony; Sciaini, Germán; Thiemann, F.; Payer, Thomas; Kremeyer, Laurenz; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Hot Carrier Transport Limits the Displacive Excitation of Coherent Phonons in Bismuth
    Appl. Phys. Lett. 119, 091601 (2021)
    DOI: 10.1063/5.0056813

  • Janoschka, David; Dreher, Pascal; Rödl, Alexandra; Franz, Torsten; Schaff, Oliver; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Implementation and Operation of a Fiber-Coupled CMOS Detector in a Low Energy Electron Microscope
    Ultramicroscopy 221, 113180 (2020)
    DOI: 10.1016/j.ultramic.2020.113180

  • Omambac, Karim; Kriegel, Marko; Brand, Christian; Finke, B.; Kremeyer, Laurenz; Hattab, H.; Janoschka, David; Dreher, Pascal; Meyer zu Heringdorf, Frank; Momeni Pakdehi, Davood; Pierz, Klaus; Schumacher, H.W.; Petrović, Marin; van Houselt, Arie; Poelsema, B.; Tringides, M.C.; Horn-Von Hoegen, Michael
    Non-Conventional Bell-Shaped Diffuse Scattering in Low-Energy Electron Diffraction from High-Quality Epitaxial 2D-Materials
    Appl. Phys. Lett. 118, 241902 (2021)
    DOI: 10.1063/5.0051220

  • Jin, Zhongwei; Janoschka, David; Deng, Junhong; Ge, Lin; Dreher, Pascal; Frank, Bettina; Hu, Guangwei; Ni, Jincheng; Yang, Yuanjie; Li, Jing; Yu, Changyuan; Lei, Dangyuan; Li, Guixin; Xiao, Shumin; Mei, Shengtao; Giessen, Harald; Meyer zu Heringdorf, Frank; Qiu, Cheng-Wei
    Phyllotaxis-Inspired Nanosieves with Multiplexed Orbital Angular Momentum
    eLight 1, (2021)
    DOI: 10.1186/s43593-021-00005-9

  • Hanisch-Blicharski, Anja; Tinnemann, Verena; Wall, Simone; Thiemann, Fabian; Groven, Thorben; Fortmann, Jonas Darius; Tajik, Mohammad; Brand, Christian; Frost, Bengt-Olaf; von Hoegen, Alexander; Horn-von Hoegen, Michael
    Violation of Boltzmann Equipartition Theorem in Angular Phonon Phase Space Slows down Nanoscale Heat Transfer in Ultrathin Heterofilms
    Nano Lett. 21, 7145–7151 (2021)
    DOI: 10.1021/acs.nanolett.1c01665

  • Omambac, Karim; Petrović, Marin; Bampoulis, Pantelis; Brand, Christian; Kriegel, Marko A.; Dreher, Pascal; Janoschka, David; Hagemann, Ulrich; Hartmann, Nils; Valerius, Philipp; Michely, Thomas; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Segregation-Enhanced Epitaxy of Borophene on Ir(111) by Thermal Decomposition of Borazine
    ACS Nano 15, 7421–7429 (2021)
    DOI: 10.1021/acsnano.1c00819

2020
 

  • Hafke, Bernd; Witte, Tobias; Brand, Christian; Horn-von Hoegen, Michael
    Adsorbate Induced Manipulation of 1D Atomic Wires : Degradation of Long-Range Order in the Si(553)-Au System
    Surf. Sci. 700, 121673 (2020)
    DOI: 10.1016/j.susc.2020.121673

  • Chen, S.; Horn-von Hoegen, Michael; Thiel, Patricia A.; Kaminski, Adam; Schrunk, Benjamin; Speliotis, Athanassios; Conrad, Edward H.; Tringides, Michael C.
    High Layer Uniformity of Two-Dimensional Materials Demonstrated Surprisingly from Broad Features in Surface Electron Diffraction
    J. Phys. Chem. Lett. 11, 8937–8943 (2020)
    DOI: 10.1021/acs.jpclett.0c02113

  • Hafke, Bernd; Brand, Christian; Witte, Tobias; Sothmann, Björn; Horn-von Hoegen, Michael; Erwin, Steven C.
    Thermally Induced Crossover from 2D to 1D Behavior in an Array of Atomic Wires : Silicon Dangling-Bond Solitons in Si(553)-Au
    Phys. Rev. Lett. 124, 016102 (2020)
    DOI: 10.1103/PhysRevLett.124.016102

  • Maldonado, Pablo; Chase, Tyler F.; Reid, Alexander H.; Shen, Xiaozhe; Li, Ren Kai; Carva, Karel; Payer, Thomas; Horn-von Hoegen, Michael; Sokolowski-Tinten, Klaus; Wang, Xi J.; Oppeneer, Peter M.; Dürr, Hermann A.
    Tracking the Ultrafast Nonequilibrium Energy Flow between Electronic and Lattice Degrees of Freedom in Crystalline Nickel
    Phys. Rev. B 101, 100302(R) (2020)
    DOI: 10.1103/PhysRevB.101.100302

  • Davis, Timothy J.; Janoschka, David; Dreher, Pascal; Frank, Bettina; Meyer zu Heringdorf, Frank; Giessen, Harald
    Ultrafast Vector Imaging of Plasmonic Skyrmion Dynamics with Deep Subwavelength Resolution
    Science 368, 6489 (2020)
    DOI: 10.1126/science.aba6415

  • Janoschka, David; Dreher, Pascal; Davis, Tim; Frank, Bettina; Gießen, Harald; Meyer zu Heringdorf, Frank
    Vector Microscopy : Nonlinear Photoemission Microscopy Reveals Plasmonic Fields
    Imaging & Microscopy 4, 34 (2020)
    DOI: 10.1002/was.000400069

2019
 

  • Chen, S.; Horn-von Hoegen, Michael; Thiel, P. A.; Tringides, M. C.
    Diffraction Paradox : An Unusually Broad Diffraction Background Marks High Quality Graphene
    Phys. Rev. B 100, 155307 (2019)
    DOI: 10.1103/PhysRevB.100.155307

  • Petrović, Marin; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Equilibrium Shape of Single-Layer Hexagonal Boron Nitride Islands on Iridium
    Sci. Rep. 9, 19553 (2019)
    DOI: 10.1038/s41598-019-56000-1

  • Hafke, Bernd; Witte, Tobias; Brand, Christian; Duden, Thomas; Horn-von Hoegen, Michael
    Pulsed Electron Gun for Electron Diffraction at Surfaces with Femtosecond Temporal Resolution and High Coherence Length
    Rev. Sci. Instrum. 90, 045119 (2019)
    DOI: 10.1063/1.5086124

  • Meyer, Dennis; Jnawali, Giriraj; Hattab, Hichem; Horn-von Hoegen, Michael
    Rapid Onset of Strain Relief by Massive Generation of Misfit Dislocations in Bi(111)/Si(001) Heteroepitaxy
    Appl. Phys. Lett. 114, 081601 (2019)
    DOI: 10.1063/1.5088760

  • Hafke, Bernd; Witte, Tobias; Janoschka, David; Dreher, Pascal; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Condensation of Ground State from a Supercooled Phase in the Si(111)-(4 × 1) → (8 × 2)-Indium Atomic Wire System
    Struct. Dyn. 6, 045101 (2019)
    DOI: 10.1063/1.5111636

  • Tinnemann, Verena; Streubühr, C.; Hafke, Bernd; Witte, Tobias; Kalus, A.; Hanisch-Blicharski, A.; Ligges, M.; Zhou, Ping; von der Linde, Dietrich; Bovensiepen, Uwe; Horn-von Hoegen, Michael
    Decelerated Lattice Excitation and Absence of Bulk Phonon Modes at Surfaces : Ultra-Fast Electron Diffraction from Bi(111) Surface Upon fs-Laser Excitation
    Struct. Dyn. 6, 065101 (2019)
    DOI: 10.1063/1.5128275

  • Schumacher, Ludmilla; Jose, Jesil; Janoschka, David; Dreher, Pascal; Davis, Timothy J.; Ligges, Manuel; Li, Renhong; Mo, Mianzhen; Park, Sung Gyu; Shen, Xiu; Weathersby, Stephen P.; Yang, Jie; Wang, Xiangxian; Meyer zu Heringdorf, Frank; Sokolowski-Tinten, Klaus; Schlücker, Sebastian
    Precision Plasmonics with Monomers and Dimers of Spherical Gold Nanoparticles : Nonequilibrium Dynamics at the Time and Space Limits
    J. Phys. Chem. C 123, 13181–13191 (2019)
    DOI: 10.1021/acs.jpcc.9b01007

  • Podbiel, Daniel; Kahl, Philip; Frank, Bettina; Davis, Timothy J.; Giessen, Harald; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Spatio-Temporal Analysis of an Efficient Fresnel Grating Coupler for Focusing Surface Plasmon Polaritons
    ACS Photonics 6, 600–604 (2019)
    DOI: 10.1021/acsphotonics.8b01565

  • Omambac, Karim; Hattab, Hichem; Brand, Christian; Jnawali, Giriraj; N'Diaye, Alpha T.; Coraux, Johann; van Gastel, Raoul; Poelsema, Bene; Michely, Thomas; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Temperature-Controlled Rotational Epitaxy of Graphene
    Nano Lett. 19, 4594 (2019)
    DOI: 10.1021/acs.nanolett.9b01565

  • Tinnemann, Verena; Streubühr, Carla; Hafke, Bernd; Kalus, Annika; Hanisch-Blicharski, Anja; Ligges, Manuel; Zhou, Ping; von der Linde, Dietrich; Bovensiepen, Uwe; Horn-von Hoegen, Michael
    Ultrafast Electron Diffraction from a Bi(111) Surface : Impulsive Lattice Excitation and Debye Waller Analysis at Large Momentum Transfer
    Struct. Dyn. 6, 035101 (2019)
    DOI: 10.1063/1.5093637

2018
 

  • Kahl, Philip; Podbiel, Daniel; Schneider, Christian; Makris, Andreas; Sindermann, Simon; Witt, Christian; Kilbane, Deirdre; Horn-von Hoegen, Michael; Aeschlimann, Martin; Meyer zu Heringdorf, Frank
    Direct Observation of Surface Plasmon Polariton Propagation and Interference by Time-Resolved Imaging in Normal-Incidence Two Photon Photoemission Microscopy
    Plasmonics 13, 239 (2018)
    DOI: 10.1007/s11468-017-0504-6

  • Petrović, Marin; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Lateral Heterostructures of Hexagonal Boron Nitride and Graphene : BCN Alloy Formation and Microstructuring Mechanism
    Appl. Surf. Sci. 455, 1086 (2018)
    DOI: 10.1016/j.apsusc.2018.06.057

  • Horn-von Hoegen, Michael
    Ultrafast Switching in an Atomic Wire System at Surfaces
    MRS Bulletin 43, 512-519 (2018)
    DOI: 10.1557/mrs.2018.150

  • Horn-von Hoegen, Michael
    Optically Excited Structural Transition in Atomic Wires on Surfaces at the Quantum Limit: a Femtosecond Ultrafast Surface Electron Diffraction Study
    Proc. SPIE 10673, Advances in Ultrafast Condensed Phase Physics, 1067304 (2018)
    DOI: 10.1117/12.2312239

  • Dreher,Pascal; Janoschka, David; Meyer zu Heringdorf, Frank
    Observing the Sub-Femtosecond Dynamics of Plasmonic Bragg Reflectors by Time-Resolved Photoemission Electron Microscopy
    Proc. SPIE 10530, Ultrafast Phenomena and Nanophotonics XXII, 105301A (2018)
    DOI: 10.1117/12.2306180

  • Dreher,Pascal; Janoschka, David; Meyer zu Heringdorf, Frank
    A Space-Time Analysis of Electron Emission from a Focusing Structure for Surface Plasmon Polaritons using Photoemission Microscopy
    Proc. SPIE 10530, Ultrafast Phenomena and Nanophotonics XXII, 105300C (2018)
    DOI: 10.1117/12.2291912

  • Frigge, Tim; Hafke, Bernd; Witte, Tobias; Krenzer, Boris; Horn-von Hoegen, Michael
    Non-Equilibrium Lattice Dynamics of One-Dimensional In Chains on Si(111) upon Ultrafast Optical Excitation
    Struct. Dyn. 5, 025101 (2018)
    DOI: 10.1063/1.5016619

2017
 

  • Podbiel, Daniel; Kahl, Philip; Makris, Andreas; Frank, Bettina; Sindermann, Simon; Davis, Timothy J.; Giessen, Harald; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Imaging the Nonlinear Plasmoemission Dynamics of Electrons from Strong Plasmonic Fields
    Nano Lett. 17, 6569–6574 (2017)
    DOI: 10.1021/acs.nanolett.7b02235

  • Petrović, Marin; Hagemann, Ulrich; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Microanalysis of Single-Layer Hexagonal Boron Nitride Islands on Ir(111)
    Appl. Surf. Sci. 420, 504-510 (2017)
    DOI: 10.1016/j.apsusc.2017.05.155

  • Witte, Tobias; Frigge, Tim; Hafke, Bernd; Krenzer, Boris; Horn-von Hoegen, Michael
    Nanoscale Interfacial Heat Transport of Ultrathin Epitaxial Hetero Films: Few Monolayer Pb(111) on Si(111)
    Appl. Phys. Lett. 110, 243103 (2017)
    DOI: 10.1063/1.4986509

  • Frigge, Tim; Hafke, Bernd; Witte, Tobias; Krenzer, Boris; Streubühr, Carla; Samad Syed, Abdul; Mikšić Trontl, Vesna; Avigo, Isabella; Zhou, Ping; Ligges, Manuel; von der Linde, Dietrich; Bovensiepen, Uwe; Horn-von Hoegen, Michael; Wippermann, Stefan; Lücke, Andreas; Sanna, Simone; Gerstmann, Uwe; Schmidt, Wolf Gerp
    Optically Excited Structural Transition in Atomic Wires on Surfaces at the Quantum Limit
    Nature 544, 207 (2017)
    DOI: 10.1038/nature21432

  • Spektor, Grisha; Kilbane, Deirdre; Mahro, Anna-Katharina; Frank, Bettina; Ristok, Simon; Gal, L.; Kahl, Philip; Podbiel, Daniel; Mathias, Stefan; Giessen, Harald; Meyer zu Heringdorf, Frank; Orenstein, Meir; Aeschlimann, Martin
    Revealing the Subfemtosecond Dynamics of Orbital Angular Momentum in Nanoplasmonic Vortices
    Science 355, 1187 (2017)
    DOI: 10.1126/science.aaj1699

  • Frank, Bettina; Kahl, Philip; Podbiel, Daniel; Spektor, Grisha; Orenstein, Meir; Fu, Liwei; Weiss, Thomas; Horn-von Hoegen, Michael; Davis, Timothy J; Meyer zu Heringdorf, Frank; Giessen, Harald
    Short-Range Surface Plasmonics: Localized Electron Emission Dynamics from a 60-nm Spot on an Atomically Flat Single-Crystalline Gold Surface
    Science Advances 3, e1700721 (2017)
    DOI: 10.1126/sciadv.1700721

  • Davis, Timothy J.; Meyer zu Heringdorf, Frank; Frank, Bettina; Kahl, Philip; Giessen, Harald; Podbiel, Daniel
    Subfemtosecond and Nanometer Plasmon Dynamics with Photoelectron Microscopy: Theory and Efficient Simulations
    ACS Photonics 4, 2461–2469 (2017)
    DOI: 10.1021/acsphotonics.7b00676

2016
 

  • Hattab, Hichem; Hupalo, Myron S.; Hershberger, M. T.; Horn-von Hoegen, Michael; Tringides, Michael C.
    A Combined STM and SPA-LEED Study of the "Explosive" Nucleation and Collective Diffusion in Pb/Si(111)
    Surf. Sci. 646, 50 (2016)
    DOI: 110.1016/j.susc.2015.08.017

  • Podbiel, Daniel; Kahl, Philip; Meyer zu Heringdorf, Frank
    Analysis of the Contrast in Normal-Incidence Surface Plasmon Photoemission Microscopy in a Pump–Probe Experiment with Adjustable Polarization
    Appl. Phys. B 122, 90 (2016)
    DOI: 10.1007/s00340-016-6363-6

  • Kirschbaum, Pierre; Brendel, Lothar; Roos, Kelly R.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Decay of Isolated Hills and Saddles on Si(001)
    Mat. Res. Exp. 3, 8 (2016)
    DOI: 10.1088/2053-1591/3/8/085011

  • McDougall, Daniel; Hattab, Hichem; Hershberger, Matthew; Hupalo, Myron S.; Horn-von Hoegen, Michael; Thiel, Patricia A.; Tringides, Michael C.
    Dy Uniform Film Morphologies on Graphene Studied with SPA-LEED and STM
    Carbon 108, 283-290 (2016)
    DOI: 10.1016/j.carbon.2016.06.083

  • Hafke, Bernd; Frigge, Tim; Witte, Tobias; Krenzer, Boris; Aulbach, Julian; Schäfer, Jörg; Claessen, Ralph; Erwin, Steve C.; Horn-von Hoegen, Michael
    Two-Dimensional Interaction of Spin Chains in the Si(553)-Au Nanowire System
    Phys. Rev. B 94, 161403 (2016)
    DOI: 10.1103/PhysRevB.94.161403

  • Meyer zu Heringdorf, Frank; Podbiel, Daniel; Raß, Nicolai; Makris, Andreas; Kahl, Philip
    Spatio-Temporal Imaging of Surface Plasmon Polaritons in Two Photon Photoemission Microscopy
    Plasmonics 9921, 992110 (2016)
    DOI: 10.1117/12.2239878

  • Sokolowski-Tinten, Klaus; Li, Renkai; Reid, Alex Hume M.; Weathersby, Stephen P.; Quirin, Florian; Chase, Tyler F.; Coffee, Ryan N.; Corbett, Jeff W.; Fry, Alan R.; Hartmann, Nick; Hast, Carsten; Hettel, Robert; Horn-von Hoegen, Michael; Janoschka, David; Jermann, M.; Lewandowski, James R.; Ligges, Manuel; Meyer zu Heringdorf, Frank; Mo, Mianzhen; Shen, Xiaozhe; Vecchione, Theodore; Witt, Christian; Wu, Juhao; Dürr, Hermann A.; Wang, Xijie
    Thickness Dependent Electron-Lattice Equilibration in Thin Bi Films Studied by Time-Resolved MeV Electron Diffraction
    International Conference on Ultrafast Phenomena UTh4A.49 (2016)
    DOI: 10.1364/UP.2016.UTh4A.49

2015
 

  • Klein, Claudius; Vollmers, N. J.; Gerstmann, Uwe; Zahl, Percy; Lükermann, Daniel; Jnawali, Giriraj; Pfnür, Herbert; Tegenkamp, Christoph; Sutter, Peter; Schmidt, Wolf G.; Horn-von Hoegen, Michael
    Barrier-Free Subsurface Incorporation of 3D Metal Atoms into Bi(111) Films
    Phys. Rev. B 91, 195441
    DOI: 10.1103/PhysRevB.91.195441

  • Schneider, Claus M.; Meyer zu Heringdorf, Frank; Kuch, Wolfgang
    Foreword for the Special Issue on the Ninth International Workshop on Low Energy Electron Microscopy and Photoemission Electron Microscopy
    Ultramicroscopy 159, V-VI (2015)
    DOI: 10.1016/S0304-3991(15)00213-2

  • Frigge, Tim; Hafke, Bernd; Tinnemann, Verena; Krenzer, Boris; Horn-von Hoegen, Michael
    Nanoscale heat transport from Ge hut, dome, and relaxed clusters on Si(001) measured by ultrafast electron diffraction
    Appl. Phys. Let. 106, 053108 (2015)
    DOI: 10.1063/1.4907636

  • Frigge, Tim; Hafke, Bernd; Tinnemann, Verena; Witte, Tobias; Krenzer, Boris; Horn-von Hoegen, Michael
    Nanoscale Thermal Transport in Self-Organized Epitaxial Ge Nanostructures on Si(001)
    Semicond. Sci. Tech. 30, 105027 (2015)
    DOI: 10.1088/0268-1242/30/10/105027

  • Frigge, Tim; Hafke, Bernd; Tinnemann, Verena; Witte, Tobias; Horn-von Hoegen, Michael
    Spot Profile Analysis and Lifetime Mapping in Ultrafast Electron Diffraction : Lattice Excitation of Self-Organized Ge Nanostructures on Si(001)
    Struc. Dyn. 2, 035101 (2015)
    DOI: 10.1063/1.4922023

  • Sokolowski-Tinten, Klaus; Li, Renkai; Reid, Alexander Hume; Weathersby, Stephen P.; Quirin, Florian; Chase, Tyler; Coffee, Ryan; Corbett, Jeff; Fry, Alan R.; Hartmann, Nick; Hast, Carsten; Hettel, Bob; Horn-von Hoegen, Michael; Janoschka, David; Lewandowski, James R.; Ligges, Manuel; Meyer zu Heringdorf, Frank; Shen, Xiaozhe; Vecchione, Theodore; Witt, Christian; Wu, J.; Durr, Hermann; Wang, X. J.
    Thickness-Dependent Electron-Lattice Equilibration in Laser-Excited Thin Bismuth Films
    New J. Phys. 17, 113047 (2015)
    DOI: 10.1088/1367-2630/17/11/113047

  • Meyer zu Heringdorf, Frank; Kahl, Philip; Makris, Andreas; Sindermann, Simon; Podbiel, Daniel; Horn-von Hoegen, Michael
    Signatures of Plasmoemission in Two Photon Photoemission Electron Microscopy
    SPIE Proceedings XIX, 93610V (2015)
    DOI: 10.1117/12.2082610

2014
 

  • Latz, Andreas; Sindermann, Simon; Brendel, Lothar; Dumpich, Günter; Meyer zu Heringdorf, Frank; Wolf, Dietrich
    Anisotropy of Electromigration-Induced Void and Island Drift
    Jour. of Phys. Condensed Matter 26, 055005 (2014)
    DOI: 10.1088/0953-8984/26/5/055005

  • Streubühr, Carla; Kalus, Annika; Zhou, Ping; Ligges, Manuel; Hanisch-Blicharski, Anja; Kammler, Martin; Bovensiepen, Uwe; Horn-von Hoegen, Michael; von der Linde, Dietrich
    Comparing Ultrafast Surface and Bulk Heating Using Time-Resolved Electron Diffraction
    Appl. Phys. Let. 104, 161611 (2014)
    DOI: 10.1063/1.4872055

  • Schumacher, Stefan; Huttmann, Felix; Petrovic, Marin; Witt, Christian; Förster, Daniel F.; Chi, Vo-Van; Coraux, Johann; Martinez-Galera, Antonio J.; Sessi, Violetta; Vergara, Ignacio; Rückamp, Reinhard; Grüninger, Markus; Schleheck, Nicolas; Meyer zu Heringdorf, Frank; Ohresser, Philippe; Kralj, Marko; Wehling, Tim O.; Michely, Thomas
    Europium Underneath Graphene on Ir(111) : Intercalation Mechanism, Magnetism, and Band Structure
    Phys. Rev. B 90, 235437 (2014)
    DOI: 10.1103/PhysRevB.90.235437

  • Klasing, Friedrich; Frigge, Tim; Hafke, Bernd; Krenzer, Boris; Wall, Simone; Hanisch-Blicharski, Anja; Horn-von Hoegen, Michael
    Hysteresis Proves that the In/Si(111) (8x2) to (4x1) Phase Transition is First-Order
    Phys. Rev. B 89, 121107(R) (2014)
    DOI: 10.1103/PhysRevB.89.121107

  • Hattab, Hichem; Jnawali, Giriraj; Horn-von Hoegen, Michael
    In-Situ High-Resolution Low Energy Electron Diffraction Study of Strain Relaxation in Heteroepitaxy of Bi(111) on Si(001) : Interplay of Strain State, Misfit Dislocation Array and Lattice Parameter
    Thin Solid Films 570, 159-163 (2014)
    DOI: 10.1016/j.tsf.2014.08.013

  • Sindermann, Simon; Latz, Andreas; Spoddig, Detlef; Schöppner, Christian; Wolf, Dietrich; Dumpich, Günter; Meyer zu Heringdorf, Frank
    Lattice Degradation by Moving Voids During Reversible Electromigration
    J. Appl. Phys. 116, 034502
    DOI: 10.1063/1.4889816

  • Kahl, Philip; Wall, Simone; Witt, Christian; Schneider, Christian; Bayer, Daniela; Fischer, Alexander; Melchior, Pascal; Horn-von Hoegen, Michael; Aeschlimann, Martin; Meyer zu Heringdorf, Frank
    Normal-Incidence Photoemission Electron Microscopy (NI-PEEM) for Imaging Surface Plasmon Polaritons
    Plasmonics 9, 1401–1407 (2014)
    DOI: 10.1007/s11468-014-9756-6

  • Klein, Claudius; Vyshnepolsky, Michael; Kompch, Alexander; Klasing, Friedrich; Hanisch-Blicharski, Anja; Winterer, Markus; Horn-von Hoegen, Michael
    Strain State, Film and Surface Morphology of Epitaxial Topological Insulator Bi2Se3 Films on Si(111)
    Thin Solid Films 564, 241-245 (2014)
    DOI: 10.1016/j.tsf.2014.04.024

  • Frank, Bettina; Ruff, Adrian; Sigle, Wilfried; Fu, Liwei; Kahl, Philip A.; Ludwigs, Sabine; van Aken, Peter A.; Osten, Wolfgang; Meyer zu Heringdorf, Frank; Braun, Paul V.; Mulvaney, Paul T.; Weiss, Thomas; Giessen, Harald W.
    Electrochemical Route to Large-Area Mono-Crystalline Gold Platelets for High-Quality Plasmonic Applications
    Advanced Photonics JTu3A.60 (2014)
    DOI: 10.1364/bgpp.2014.jtu3a.60

2013
 

  • Klein, Claudius; Heidmann, Inga; Nabbefeld, Tobias; Speckmann, Moritz; Schmidt, Thomas; Meyer zu Heringdorf, Frank; Falta, Jens; Horn-von Hoegen, Michael
    Al-induced faceting of Si(113)
    J. Surf. S. 618, 109-114 (2013)
    DOI: 10.1016/j.susc.2013.08.007

  • Lükermann, Daniel; Sologub, S.; Pfnür, Herbert; Klein, Claudius; Horn-von Hoegen, Michael; Tegenkamp, Christoph
    Effect of Adsorbed Magnetic and Non-Magnetic Atoms on Electronic Transport Through Surfaces with Strong Spin-Orbit Coupling
    Materials Science and Engineering Technology 44, 210-217 (2013)
    DOI: 110.1002/mawe.201300114

  • Vyshnepolsky, Michael; Klein, Claudius; Klasing, Friedrich; Hanisch-Blicharski, Anja; Horn-von Hoegen, Michael
    Epitaxial Growth of the Topological Insulator Bi2Se3 on Si(111) : Growth Mode, Lattice Parameter, and Strain State
    Appl. Phys. Lett. 103, 111909 (2013)
    DOI: 10.1063/1.4821181

  • Frigge, Tim; Wall, Simone; Krenzer, Boris; Wippermann, Stefan; Sanna, Simone; Klasing, Friedrich; Hanisch-Blicharski, Anja; Kammler, Martin; Schmidt, Wolf G.; Horn-von Hoegen, Michael
    Frigge et al. Reply : Comment on “Atomistic Picture of Charge Density Wave Formation at Surfaces”
    Phys. Rev. Lett. 111, 149602 (2013)
    DOI: 10.1103/PhysRevLett.111.149602

  • Mohamadie Buckanie, Niemma; Kirschbaum, Pierre; Sindermann, Simon; Meyer zu Heringdorf, Frank
    Interaction of Light and Surface Plasmon Polaritons in Ag Islands Studied by Nonlinear Photoemission Microscopy
    Ultramicroscopy 130, 53 (2013)
    DOI: 10.1016/j.ultramic.2013.03.007

  • Sindermann, Simon; Latz, Andreas; Dumpich, Günter; Wolf, Dietrich; Meyer zu Heringdorf, Frank
    Lattice Dependent Motion of Voids During Electromigration
    J. Appl. Phys. 113, 134505 (2013)
    DOI: 10.1063/1.4798367

  • Sakong, Sung; Kratzer, Peter; Wall, Simone; Kalus, Annika; Horn-von Hoegen, Michael
    Mode Conversion and Long-Lived Vibrational Modes in Lead Monolayers on Silicon (111) After Femtosecond Laser Excitation : A Molecular Dynamics Simulation
    Phys. Rev. B 88, 115419 (2013)
    DOI: 10.1103/PhysRevB.88.115419

  • Sojka, Falko; Meissner, Matthias; Zwick, Christian; Forker, Roman; Vyshnepolsky, Michael; Klein, Claudius; Horn-von Hoegen, Michael; Fritz, Torsten
    To tilt or not to tilt : correction of the distortion caused by inclined sample surfaces in low-energy electron diffraction
    Ultramicroscopy 133, 35-40 (2013)
    DOI: 10.1016/j.ultramic.2013.04.005

  • Hanisch-Blicharski, Anja; Janzen, Andreas; Krenzer, Boris; Wallutis, Simone; Klasing, Friedrich; Kalus, Annika; Frigge, Tim; Kammler, Martin; Horn-von Hoegen, Michael
    Ultra-Fast Electron Diffraction at Surfaces: From Nanoscale Heat Transport to Driven Phase Transitions
    Ultramicroscopy 127, 2-8 (2013)
    DOI: 110.1016/j.ultramic.2012.07.017

  • Nicoul, Matthieu; Quirin, Florian; Lindenberg, A.M.; Barty, A.; Fritz, D.M.; Zhu, D.; Lemke, H.; Chollet, M.; Reis, D.A.; Chen, J.; Ghimire, S.; Trigo, M.; Fuchs, M.; Gaffney, K.J.; Larsson, J.; Becker, Tim; Meyer, Sven; Payer, Thomas; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael; Jerman, Martin; Sokolowski-Tinten, Klaus
    Ultrafast Laser-Induced Melting and Ablation Studied by Time-Resolved Diffuse X-Ray Scattering
    EPJ Web of Conferences 41, 04013 (2013)
    DOI: 10.1051/epjconf/20134104013

  • Zhou, Ping; Streubühr, Carla; Kalus, Annika; Frigge, Tim; Wall, Simone; Hanisch-Blicharski, Anja; Kammler, Martin; Ligges, Manuel; Bovensiepen, Uwe; von der Linde, Dietrich; Horn-von Hoegen, Michael
    Ultrafast Time Resolved Reflection High Energy Electron Diffraction with Tilted Pump Pulse Fronts
    EPJ Web of Conferences 41, 10016 (2013)
    DOI: 10.1051/epjconf/20134110016

2012
 

  • Wall, Simone; Krenzer, Boris; Wippermann, Stefan; Sanna, Simone; Klasing, Friedrich; Hanisch-Blicharski, Anja; Kammler, Martin; Schmidt, Wolf G.; Horn-von Hoegen, Michael
    Atomistic Picture of Charge Density Wave Formation at Surfaces
    Phys. Rev. Let. 109, 186101 (2012)
    DOI: 10.1103/PhysRevLett.109.186101

  • Hanisch-Blicharski, Anja; Krenzer, Boris; Wall, Simone; Kalus, Annika; Frigge, Tim; Horn-von Hoegen, Michael
    Heat Transport Through Interfaces with and without Misfit Dislocation Arrays
    J. of Mater. Research 27, 2718-2713 (2012)
    DOI: 10.1557/jmr.2012.316

  • Payer, T.; Klein, Carsten; Acet, Mehmet; Ney, V.; Kammler, Martin; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    High-Quality Epitaxial Bi(111) Films on Si(111) by Isochronal Annealing
    Thin Solid Films 520, 6905-6908 (2012)
    DOI: 10.1016/j.tsf.2012.06.004

  • Kirschbaum, Pierre; Mohamadie Buckanie, Niemma; Meyer zu Heringdorf, Frank
    Impact of C60 Adsorption on Surface Plasmon Polaritons on Self-Assembled Ag(111) Islands on Si(111)
    Plasmonics 7, 229-233 (2012)
    DOI: 10.1007/s11468-011-9298-0

  • Hattab, Hichem; N'Diaye, Alpha T.; Wall, Dirk; Klein, Claudius; Jnawali, Giriraj; Coraux, Johann; Busse, Carsten; van Gastel, Raoul; Poelsema, Bene; Michely, Thomas; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Interplay of Wrinkles, Strain, and Lattice Parameter in Graphene on Iridium
    Nano Lett. 12, 678-682 (2012)
    DOI: 10.1021/nl203530t

  • Jnawali, Giriraj; Klein, Claudius; Wagner, Thomas; Hattab, Hichem; Zahl, Percy; Acharya, Danda P.; Sutter, Peter; Lorke, Axel; Horn-von Hoegen, Michael
    Manipulation of Electronic Transport in the Bi(111) Surface State
    Phys. Rev. Let. 108, 266804 (2012)
    DOI: 10.1103/PhysRevLett.108.266804

  • Lükermann, Daniel; Sologub, Sergei; Pfnür, Herbert; Klein, Claudius; Horn-von Hoegen, Michael; Tegenkamp, Christoph
    Scattering at Magnetic and Nonmagnetic Impurities on Surfaces with Strong Spin-Orbit Coupling
    Phys. Rev. B 86, 195432 (2012)
    DOI: 10.1103/PhysRevB.86.195432

  • Latz, Andreas; Sindermann, Simon; Brendel, Lothar; Dumpich, Günter; Meyer zu Heringdorf, Frank; Wolf, Dietrich
    Simulation of Electromigration Effects on Voids in Monocrystalline Ag Films
    Phys. Rev. B 85, 035449 (2012)
    DOI: 10.1103/PhysRevB.85.035449

  • Wall, Simone; Thien, Dagmar; Meyer zu Heringdorf, Frank
    The Interplay of Topography and Energy Dissipation in Pentacene Thin Films
    Journal of Electron Spectroscopy and Related Phenomena 185, 436-440 (2012)
    DOI: 10.1016/j.elspec.2012.09.007

  • Zhou, Ping; Streubühr, Carla; Ligges, Manuel; Brazda, Thorsten; Payer, Thomas; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael; von der Linde, Dietrich
    Transient Anisotropy in the Electron Diffraction of Femtosecond Laser-Excited Bismuth
    New J. Phys. 14, 103031 (2012)
    DOI: 10.1088/1367-2630/14/10/103031

  • Frigge, Tim; Kalus, Annika; Klasing, Friedrich; Kammler, Martin; Hanisch-Blicharski, Anja; Horn-von Hoegen, Michael
    Nanoscale Heat Transport in Self-Organized Ge Clusters on Si(001)
    Nanoscale Thermoelectrics 1456, 45–50 (2012)
    DOI: 10.1557/opl.2013.148

2011
 

  • Moutanabbir, Oussama; Senz, Stephan; Scholz, Roland; Alexe, Marin; Kim, Yunseok; Pippel, Eckhard; Wang, Yewu; Wiethoff, Christian; Nabbefeld, Tobias; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Atomically Smooth p-Doped Silicon Nanowires Catalyzed by Aluminum at Low Temperature
    ACS Nano 5, 1313–1320 (2011)
    DOI: 10.1021/nn1030274

  • Sindermann, Simon; Witt, Christian; Spoddig, Detlef; Horn-von Hoegen, Michael; Dumpich, Günter; Meyer zu Heringdorf, Frank
    Epitaxial Ag Wires with a Single Grain Boundary for Electromigration
    Rev. Sci. Instrum. 82, 123907 (2011)
    DOI: 10.1063/1.3671802

  • Hattab, Hichem; N'Diaye, Alpha T.; Wall, Dirk; Jnawali, Giriraj; Coraux, Johann; Busse, Carsten; van Gastel, Raoul; Poelsema, Bene; Michely, Thomas; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Growth Temperature Dependent Graphene Alignment on Ir(111)
    Appl. Phys. Lett. 98, 141903 (2011)
    DOI: 10.1063/1.3548546

  • Klein, Claudius; Nabbefeld, Tobias; Hattab, Hichem; Meyer, D.; Jnawali, Giriraj; Kammler, Martin; Meyer zu Heringdorf, Frank; Golla-Franz, A.; Müller, B.H.; Schmidt, T.H.; Henzler, M.; Horn-von Hoegen, Michael
    Lost in Reciprocal Space? : Determination of Scattering Condition in Spot Profile Analysis Low Energy Electron Diffraction
    Rev. Sci. Instrum. 82, 035111 (2011)
    DOI: 10.1063/1.3554305

  • Wall, Dirk; Tikhonov, S.; Sindermann, Simon; Spoddig, Detlef; Hassel, Christoph; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Shape, Orientation, and Crystalline Composition of Silver Islands on Si(111)
    IBM Journal of Research and Development 55, 9:1-9:6 (2011)
    DOI: 10.1147/JRD.2011.2158761

  • Meyer zu Heringdorf, Frank; Wall, Dirk; Roos, K. R.; Lohmar, I.; Krug, J.; Horn-von Hoegen, Michael
    Dynamics of Reconstructed Zones Formed Around Islands on Si During Desorption : Diffusion Made Visible
    Proceedings of the ALC 11 Coference 372 (2011)

  • Hanisch-Blicharski, Anja; Wall, Simone; Kalus, Annika; Frigge, Tim; Horn-von Hoegen, Michael
    Nanoscale Heat Transport through Epitaxial Ultrathin Hetero Films : Bi(111)/Si(001) and Bi(111)/Si(111)
    MRS Online Proceedings Library 1404, 72–77 (2012)
    DOI: 10.1557/opl.2012.472

2010
 

  • Sindermann, Simon; Wall, Dirk; Roos, K.R.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Anisotropy of Ag Diffusion on Vicinal Si Surfaces
    Elec. J. of Surf. Sci. and Nanotechnol. 8, 372-376 (2010)
    DOI: 10.1380/ejssnt.2010.372

  • Lu, Wei; Nicoul, Matthieu; Shymanovich, Uladzimir; Tarsevitch, Alexander; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus
    Extreme Phonon Softening in Laser-Excited Bismuth - Towards an Inverse Peierls-Transition
    MRS Symp. Proc. 1230E, MM03-05 (2010)
    DOI: 10.1557/PROC-1230-MM03-05

  • Wall, Dirk; Lohmar, I.; Roos, Kelly Ryan; Krug, J.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Imaging Diffusion Fields on a Surface with Multiple Reconstructions: Ag/Si(111)
    New J. Phys. 12, 103019 (2010)
    DOI: 10.1088/1367-2630/12/10/103019

  • Meyer zu Heringdorf, Frank; Mohamadie Buckanie, Niemma
    Nonlinear Photoemission Microscopy with Surface Plasmon Polaritons
    Microscopy and Microanalysis 16, 502–503 (2010)
    DOI: 10.1017/S1431927610057557

  • Nabbefeld, Tobias; Wiethoff, Christian; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Silver Induced Faceting of Si(112)
    Appl. Phys. Lett. 97, 041905 (2010)
    DOI: 10.1063/1.3464555

  • Jnawali, Giriraj; Wagner, Th.; Hattab, Hichem; Möller, Rolf; Lorke, Axel; Horn-von Hoegen, Michael
    Two-Dimensional Electron Transport and Scattering in Bi(111) Surface States
    Elec. J. of Surf. Sci. and Nanotechnol. 8, 27-31 (2010)
    DOI: 10.1380/ejssnt.2010.27

  • Shymanovich, Uladzimir; Nicoul, Matthieu; Lu, Wei; Tarasevitch, Alexander; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus
    Coherent Acoustic and Optical Phonons in Laser-Excited Solids Studied by Ultrafast Time-Resolved X-Ray Diffraction
    AIP Conf. Proc. 1278, 558-566 (2010)
    DOI: 10.1063/1.3507146

  • Shymanovich, Uladzimir; Nicoul, Matthieu; Kähle, Stefan; Lu, Wei; Tarsevitch, Alexander; Zhou, Ping; Wietler, Tobias; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus
    The Role of Thermal and Electronic Pressure in the Picosecond Acoustic Response of Femtosecond Laser-Excited Solids
    MRS Online Proceedings Library volume 1230, 603 (2009)
    DOI: 10.1557/PROC-1230-MM06-03

  • Lu, Wei; Nicoul, Matthieu; Shymanovich, Uladzimir; Tarasevitch, Alexander; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Sokolowski-Tinten, Klaus
    Transient reversal of a peierls-transition : Extreme phonon softening in laser-excited bismuth
    International Conference on Ultrafast Phenomena UP2010, ME41 (2010)
    DOI: 10.1364/up.2010.me41

  • Möllenbeck, Simone; Hanisch-Blicharski, Anja; Schneider, Paul; Ligges, Manuel; Zhou, Ping; Kammler, Martin; Krenzer, Boris; Horn-von Hoegen, Michael
    Ultra-Fast Time-Resolved Electron Diffraction of Strongly Driven Phase Transitions on Silicon Surfaces
    MRS Symp. Proc. 1230E, MMM06-03 (2010)
    DOI: 10.1557/PROC-1230-MM03-09

2009
 

  • Jnawali, Giriraj; Hattab, Hichem; Bobisch, Christian; Zubkov, E.; Deiter, C.; Weisemoeller, T.; Bertram, F.; Wollschläger, J.; Möller, Rolf; Horn-von Hoegen, Michael
    Epitaxial Growth of Bi(111) on Si(001)
    e-JSSNT 7, 441-447 (2009)
    DOI: 10.1380/ejssnt.2009.441

  • Mohamadie Buckanie, Niemma; Meyer zu Heringdorf, Frank
    Exciton Sensitive Microscopy of Anthracene Monolayers on Si(111)
    Organic Electronics 10, 446-452 (2009)
    DOI: 10.1016/j.orgel.2009.01.007

  • Jnawali, Giriraj; Hattab, Hichem; Bobisch, Christian A.; Bernhart, Alexander M.; Zubkov, E.; Möller, Rolf; Horn-von Hoegen, Michael
    Nanoscale Dislocation Patterning in Bi(1 1 1)/Si(0 0 1) Heteroepitaxy
    Surf. Sci. 603, 2057-2061 (2009)
    DOI: 10.1016/j.susc.2009.03.027

  • Jnawali, Giriraj; Wagner, Th.; Hattab, Hichem; Möller, Rolf; Horn-von Hoegen, Michael
    Nucleation and Initial Growth in the Semimetallic Homoepitaxial System of Bi on Bi(111),
    Phys. Rev. B 79, 193306 (2009)
    DOI: 10.1103/PhysRevB.79.193306

  • van Gastel, Raoul; N'Diaye, Alpha T.; Wall, Dirk; Coraux, Johann; Busse, Carsten; Mohamadie Buckanie, Niemma; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael; Michely, Thomas; Poelsema, Bene
    Selecting a Single Orientation for Millimeter Sized Graphene Sheets
    Appl. Phys. Lett. 95, 121901 (2009)
    DOI: 10.1063/1.3225554

  • Jnawali, Giriraj; Meyer zu Heringdorf, Frank; Wall, Dirk; Sindermann, Simon; Horn-von Hoegen, Michael
    Stable Tungsten Disilicide Contacts for Surface and Thin Film Resistivity Measurements
    J. Vac. Sci. Technol. B 27, 180-183 (2009)
    DOI: 10.1116/1.3071851

  • Kaspers, Mark; Bernhart, Alexander; Meyer zu Heringdorf, Frank; Dumpich, Günter; Möller, Rolf
    Electromigration and Potentiometry Measurements of Single-Crystalline Ag Nanowires under UHV conditions
    J. Phys.: Condens. Matter 21, 265601 (2009)
    DOI: 10.1088/0953-8984/21/26/265601

  • Sciaini, Germán; Harb, Maher; Kruglik, Sergei G.; Payer, Thomas; Hebeisen, Christoph T.; Meyer zu Heringdorf, Frank; Yamaguchi, Mariko; Horn-von Hoegen, Michael; Ernstorfer, Ralph; Miller, R. J. Dwayne
    Electronic Acceleration of Atomic Motions and Disordering in Bismuth
    Nature 458, 56–59 (2009)
    DOI: 10.1038/nature07788

  • Coraux, Johann; N'Diaye, Alpha T; Engler, Martin; Busse, Carsten; Wall, Dirk; Mohamadie Buckanie, Niemma; Meyer zu Heringdorf, Frank; van Gastel, Raoul; Poelsema, Bene; Michely, Thomas
    Growth of Graphene on Ir(111)
    New J. Phys. 11, 23006(2009)
    DOI: 10.1088/1367-2630/11/2/023006

  • N'Diaye, Alpha T.; van Gastel, Raoul; Martínez-Galera, Antonio J; Coraux, Johann; Hattab, Hichem; Meyer zu Heringdorf, Frank; Wall, Dirk; Horn-von Hoegen, Michael; Gomez-Rodriguez, José M; Poelsema, Bene; Busse, Carsten; Michely, Thomas
    In Situ Observation of Stress Relaxation in Epitaxial Graphene
    New J. Phys. 11, 113056 (2009)
    DOI: 10.1088/1367-2630/11/11/113056

  • Krenzer, Boris; Hanisch-Blicharski, Anja; Schneider, P.; Payer, Thomas; Möllenbeck, Simone; Osmani, Orkahn; Kammler, Martin; Meyer, Ralf; Horn-von Hoegen, Michael
    Phonon Confinement Effects in Ultrathin Epitaxial Bismuth Films on Silicon Studied by Time-Resolved Electron Diffraction
    Phys. Rev. B 80, 24307 (2009)
    DOI: 10.1103/PhysRevB.80.024307

  • Mohamadie Buckanie, Niemma; Göhre, J.; Zhou, Ping; von der Linde, Dietrich; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Space Charge Effects in Photoemission Electron Microscopy Using Amplifed Femtosecond Laser Pulses
    J. Phys.: Condens. Matter 21, 314003 (2009)
    DOI: 10.1088/0953-8984/21/31/314003

  • Wall, Dirk; Sindermann, Simon; Roos, K.R.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    The Influence of Anisotropic Diffusion on Ag Nanowire Formation
    J. Phys.: Condens. Matter 21, 314023 (2009)
    DOI: 10.1088/0953-8984/21/31/314023

  • Hanisch-Blicharski, Anja; Krenzer, Boris; Möllenbeck, Simone; Ligges, Manuel; Zhou, Ping; Kammler, Martin; Horn-von Hoegen, Michael
    Transient Cooling of Ultrathin Epitaxial Bi(111)-Films on Si(111) upon Femtosecond Laser Excitation Studied by Ultrafast Reflection High Energy Electron Diffraction"
    MRS Proceedings 1172, T04-T08 (2009)
    DOI: 10.1172/T04.T08

2008
 

  • Kury, Peter; Roos, Kelly R.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Absence of Surface Stress Change During Pentacene Thin Film Growth on the Si(111)-(7x7) Surface : A Buried Reconstruction Interface
    New J. of Physcis 10, 023037 (2008)
    DOI: 10.1088/1367-2630/10/2/023037

  • Wiethoff, Christian; Ross, Frances M.; Copel, Matthew; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Au Stabilization and Coverage of Sawtooth Facets on Si Nanowires Grown by Vapor-Liquid-Solid Epitaxy
    Nano Letters 8, 3065 (2008)
    DOI: 10.1021/nl801146q

  • Horn-von Hoegen, Michael
    Der Widerstand eines Atoms : Elektromigration im Miniaturformat
    Essener Unikate: Berichte aus Forschung und Lehre 32, 8 (2008)
    DOI: 10.17185/duepublico/73800

  • Kury, Peter; Roos, Kelly Ryan; Thien, Dagmar; Möllenbeck, Simone; Wall, Dirk; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Disorder-Mediated Ordering by Self-Interfactant Effect in Organic Thin Film Growth of Pentacene on Silicon
    Organic Electronics 9, 461 (2008)
    DOI: 10.1016/j.orgel.2008.02.006

  • Hattab, Hichem; Zubkov, E.; Bernhart, Alexander; Jnawali, Giriraj; Bobisch, Christian; Krenzer, Boris; Acet, Mehmet; Möller, Rolf; Horn-von Hoegen, Michael
    Epitaxial Bi(111) Films on Si(001) : Strain State, Surface Morphology, and Defect Structure
    Thin Solid Films 516, 8227-8231 (2008)
    DOI: 10.1016/j.tsf.2008.02.038

  • Meyer zu Heringdorf, Frank; Roos, Kimberly L.; Wiethoff, Christian; Horn-von Hoegen, Michael; Roos, Kelly R.
    Growth of g Nanowires on Au-Pre-Facetted 4° Vicinal Si(0 0 1)
    Surf. Sci. 602, 1852-1857 (2008)
    DOI: 10.1016/j.susc.2008.03.023

  • Krenzer, Boris; Hanisch-Blicharski, Anja; Duvenbeck, Andreas; Rethfeld, Bärbel; Horn-von Hoegen, Michael
    Heat transport in nanoscale heterosystems: a numerical simulation and analytical solution
    J. of Nanomat. 2008, 590609 (2008)
    DOI: 10.1155/2008/590609

  • Jnawali, Giriraj; Hattab, Hichem; Bobisch, Christian; Bernhart, Alexander; Zubkov, E.; Möller, Rolf; Horn-von Hoegen, Michael
    Homoepitaxial Growth of Bi(111)
    Phys. Rev. B 78, 035321 (2008)
    DOI: 10.1103/PhysRevB.78.035321

  • Wall, Dirk; Roos, Kelly Ryan; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    LEEM/PEEM Study of Anisotropic Diffusion Fields in the Ag/Si(001) System
    Mater. Res. Soc. Symp. Proc. 1088E, 1088-W05-04 (2008)
    DOI: 10.1557/PROC-1088-W05-04

  • Roos, Kelly Ryan; Roos, Kimberly L.; Lohmar, I.; Wall, Dirk; Krug, J.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Real-Time View of Mesoscopic Surface Diffusion
    Phys. Rev. Lett. 100, 016103 (2008)
    DOI: 10.1103/PhysRevLett.100.016103

  • Meyer zu Heringdorf, Frank
    The Application of Low Energy Electron Microscopy and Photoemission Electron Microscopy to Organic Thin Films
    J. Phys.: Condens. Matter 20, 184007 (2008)
    DOI: 10.1088/0953-8984/20/18/184007

  • Hanisch-Blicharski, Anja; Krenzer, Boris; Pelka, Tobias; Möllenbeck, Simone; Horn-von Hoegen, Michael
    Thermal Response of Epitaxial Thin Bi Films on Si(001) Upon Femtosecond Laser Excitation Studied by Ultrafast Electron Diffraction
    Phys. Rev. B 77, 125410 (2008)
    DOI: 10.1103/PhysRevB.77.125410

  • Payer, Thomas; Rajkovic, Ivan; Ligges, Manuel; von der Linde, Dietrich; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    Ultrathin Epitaxially Grown Bismuth (111) Membranes
    Appl. Phys. Lett. 93, 93102 (2008)
    DOI: 10.1063/1.2976558

2007
 

  • Janzen, A.; Krenzer, Boris; Heinz, Oliver; Zhou, Ping; Thien, Dagmar; Hanisch-Blicharski, Anja; Meyer zu Heringdorf, Frank; von der Linde, Dietrich; Horn-von Hoegen, Michael
    A Pulsed Electron Gun for Ultrafast Electron Diffraction at Surfaces
    Rev. Sci. Instrum. 78, 013906 (2007)
    DOI: 10.1063/1.2431088

  • Shymanovich, Uladzimir; Nicoul, Matthieu; Blums, J.; Sokolowski-Tinten, Klaus; Tarasevitch, Alexander; Wietler, T.; Horn-von Hoegen, Michael; von der Linde, Dietrich
    Diffraction of Strongly Convergent X-Rays from Picosecond Acoustic Transients
    Appl. Phys. A 87, 7-11 (2007)
    DOI: 10.1007/s00339-007-3863-6

  • Thien, Dagmar; Kury, Peter; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank; van Heys, J.; Lindenblatt, M.; Pehlke, E.
    Domain Sensitive Contrast in Photoelectron Emission Microscopy
    Phys. Rev. Lett. 99, 196102 (2007)
    DOI: 10.1103/PhysRevLett.99.196102

  • Meyer zu Heringdorf, Frank; Chelaru, L.I.; Möllenbeck, Simone; Thien, Dagmar; Horn-von Hoegen, Michael;
    Femtosecond Photoemission Microscopy
    Surf. Sci. 601, 4700-4705 (2007)
    DOI: 10.1016/j.susc.2007.05.052

  • Chelaru, Liviu I.; Meyer zu Heringdorf, Frank;
    In situ Monitoring of Surface Plasmons in Single-Crystalline Ag Nanowires
    Surf. Sci. 601, 4541-4545 (2007)
    DOI: 10.1016/j.susc.2007.04.146

  • Jnawali, Giriraj; Hattab, Hichem; Meyer zu Heringdorf, Frank; Krenzer, Boris; Horn-von Hoegen, Michael
    Lattice-Matching Periodic Array of Misfit Dislocations: Heteroepitaxy of Bi(111) on Si(001)
    Phys. Rev. B 76, 035337 (2007)
    DOI: 10.1103/PhysRevB.76.035337

  • Jnawali, Giriraj; Hattab, Hichem; Bobisch, Christian; Bernhart, A.; Zubkov, E.; Meyer zu Heringdorf, Frank; Möller, Rolf; Krenzer, Boris; Horn-von Hoegen, Michael
    Nanopattern Formation by Periodic Array of Interfacial Misfit Dislocations in Bi(111)/Si(001) Heteroepitaxy
    MRS Online Proceedings Library Archive 1059, 707 (2007)
    DOI: 10.1557/PROC-1059-KK07-07

  • Mohamadie Buckanie, Niemma; Meyer zu Heringdorf, Frank
    Photoemission Electron Microscopy Study of Anthracene Growth on Si(111)
    Surface Science 601, 1701-1704 (2007)
    dx.doi.org/

  • Fritz, D.M.; Reis, D.A.; Adams, B.; Akre, R.A.; Arthur, J.; Blome, C.; Bucksbaum, P.H.; Cavalieri, A.L.; Engemann, S.; Fahy, S.; Falcone, R.W.; Fuoss, P.H.; Gaffney, K.J; George, M.J.; Hajdu, J.; Hertlein, M.P.; Hillyard, P.B.; Horn-von Hoegen, Michael; Kammler, Martin; Kaspar, J.; Kienberger, R.; Krejcik, P.; Lee, S.H.; Lindenberg, A.M.; McFarland, B.; Meyer, D.; Montagne, T.; Murray, E.D.; Nelson, A.J.; Nicoul, Matthieu; Pahl, R.; Rudati, J.; Schlarb, H.; Siddons, D.P.; Sokolowski-Tinten, Klaus; Tschentscher, Th.; von der Linde, Dietrich; Hastings, J.B.
    Ultrafast bond softening in Bismuth: Mapping a solid`s interatomic potential with X-rays
    Science 315, 633-636 (2007)
    10.1126/science.1135009

2006
 

  • Meyer zu Heringdorf, Frank
    Analysis of Mesoscopic Patterns Formed by the Au-Induced Faceting of Vicinal Si(001)
    J. Phys.: Condens. Matter 18, S1 (2006)
    DOI: 10.1088/0953-8984/18/13/S01

  • Pennec, Y.; Horn-von Hoegen, Michael; Zhu, Xiaobin; Fortin, D.C.; Freeman, M.R.
    Dynamics of an Ising Chain under Local Excitation: An STM Study of Si(100) Dimer Rows at T = 5K
    Phys. Rev. Lett. 96, 026102 (2006)
    DOI: 10.1103/PhysRevLett.96.026102

  • Stahlmecke, Burkhard; Chelaru, L.I.; Meyer zu Heringdorf, Frank; Dumpich, Günter
    Electromigration in Gold and Single Crystalline Silver Nanowires.
    AIP Conf. Proc. 817, 65–70 (2006)
    DOI: 10.1063/1.2173533

  • Stahlmecke, Burkhard; Meyer zu Heringdorf, Frank; Chelaru, L.I.; Horn-von Hoegen, Michael; Roos, Kelly R.; Dumpich, Günter
    Electromigration in Single-Crystalline Self-Organized Silver Nanowires
    Appl. Phys. Lett. 88, 053122 (2006)
    DOI: 10.1063/1.2172012

  • Chelaru, L.I.; Horn-von Hoegen, Michael; Thien, Dagmar; Meyer zu Heringdorf, Frank
    Fringe Fields in Nonlinear Photoemission Microscopy
    Phys. Rev.B 73, 115416 (2006)
    DOI: 10.1103/PhysRevB.73.115416

  • Jnawali, Giriraj; Hattab, Hichem; Krenzer, B.; Horn-von Hoegen, Michael
    Lattice Accommodation of Epitaxial Bi(111) Films on Si(001) Studied with SPA-LEED and AFM,
    Phys. Rev. B 74, 195340 (2006)
    DOI: 10.1103/PhysRevB.74.195340

  • Schmidt, Th.; Kröger, R.; Flege, J.I.; Clausen, T.; Falta, J.; Janzen, A.; Zahl, P.; Kury, Peter; Kammler, Martin; Horn-von Hoegen, Michael
    Less Strain Energy Despite Fewer Misfit Dislocations: The impact of ordering
    Phys. Rev. Lett. 96, 066101 (2006)
    DOI 10.1103/PhysRevLett.96.066101:

  • Krenzer, B.; Janzen, A.; Zhou, Ping; von der Linde, Dietrich; Horn-von Hoegen, Michael
    Thermal Boundary Conductance in Heterostructures Studied by Ultrafast Electron Diffraction,
    New J. Phys. 8, 190 (2006)
    DOI: 10.1088/1367-2630/8/9/190

  • Chelaru, Liviu I.; Meyer zu Heringdorf, Frank
    Three-Dimensional Size Determination of Particles with Photoelectron Emission Microscopy
    Appl. Phys. Lett. 89, 241908 (2006)
    DOI: 10.1063/1.2404968

  • Janzen, A.; Krenzer, Boris; Zhou, Ping; von der Linde, Dietrich; Horn-von Hoegen, Michael;
    Ultrafast Electron Diffraction at Surfaces after Laser Excitation
    Surface Science 600, 4094-4098 (2006)
    DOI: 10.1016/j.susc.2006.02.070

2005
 

  • Kury, Peter; Hild, R.; Thien, Dagmar; Günter, H.-L.; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Compact and Transferable Threefold Evaporator for Molecular Beam Epitaxy in Ultrahigh Vacuum
    Rev. Sci. Instrum. 76, 083906 (2005)
    DOI: 10.1063/1.2001665

  • Roos, Kelly Ryan; Roos, Kimberley L.; Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank
    High Temperature Self-Assembly of Ag Nanowires on Vicinal Si(001)
    J. Phys.: Condens. Matter 17, S1407 (2005) Nr. 16,
    DOI: 10.1088/0953-8984/17/16/011

  • Kammler, Martin; Horn-von Hoegen, Michael
    Low Energy Electron Dffraction of Epitaxial Growth of Bismuth on Si(111)
    Surf. Sci. 576, 56-60 (2005)
    DOI: 10.1016/j.susc.2004.11.033

  • Meyer zu Heringdorf, Frank; Pietsch, H.; Horn-von Hoegen, Michael
    Reciprocal Space Mapping by Spot Profile Analyzing Low Energy Electron Diffraction
    Rev. Sci. Instrum. 76, 085102 (2005)
    Article: 76/8/085102/823560/

  • Kury, Peter; Grabosch, T.; Horn-von Hoegen, Michael
    SSIOD: The next generation
    Rev. Sci. Instrum. 76, 023903 (2005)
    DOI: 10.1063/1.1844191

  • AlFalou, A.A.; Kammler, Martin; Horn-von Hoegen, Michael
    Strain State Analysis of Hetero-Epitaxial Systems
    Europhysics Lett. 69, 570-578 (2005)
    DOI: 10.1209/epl/i2004-10399-6

  • Schmidt, Th.; Kröger, R.; Clausen, T.; Falta, J.; Janzen, A.; Kammler, Martin; Kury, Peter; Zahl, P.; Horn-von Hoegen, Michael
    Surfactant-Mediated Epitaxy of Ge on Si(111): beyond the surface
    Appl. Phys. Lett. 86, 111910 (2005)
    DOI: 10.1063/1.1882760

  • Sokolowski-Tinten, Klaus; Blome, C.; Blums, J.; Shymanovich, Uladzimir; Nicoul, Matthieu; Cavalleri, Andrea; Tarasevitch, Alexander; Horn-von Hoegen, Michael; Kammler, Martin; von der Linde, Dietrich
    Ultrafast X-Ray Diffraction
    Ultrafast Phenomena XIV 79, 170–174 (2005)
    DOI: 10.1007/3-540-27213-5_53

2004
 

  • Kury, Peter; Zahl, P.; Horn-von Hoegen, Michael
    Direct Observation of Reconstruction Induced Changes of Surface Stress for Sb on Si(111)
    Analytical and Bioanalytical Chemistry 379, 582-587 (2004)
    DOI: 10.1007/s00216-003-2471-3

  • Kury, Peter; Zahl, P.; Horn-von Hoegen, Michael
    Precise Calibration for Surface Stress Induced Optical Deflection Measurements
    Rev. Sci. Instrum. 75, 2211–2212 (2004)
    DOI: 10.1063/1.1753682

  • Horn-von Hoegen, Michael; Müller, B.H.; Grabosch, T.; Kury, Peter
    Strain Relief During Ge Hut Cluster Formation on Si(001) Studied by High Resolution LEED and Surface-Stress-Induced Optical Deflection,
    Phys. Rev. B 70, 235313 (2004)
    DOI: 10.1103/PhysRevB.70.235313

  • Kammler, Martin; Horn-von Hoegen, Michael
    Transition in Growth Mode by Competing Strain Relaxation Mechanisms: Surfactant Mediated Epitaxy of SiGe alloys on Si
    Appl. Phys. Lett. 85, 3056–3058 (2004)
    DOI: 10.1063/1.1803914

  • Thien, Dagmar; Meyer zu Heringdorf, Frank; Kury, Peter; Horn-von Hoegen, Michael
    Characterizing Single Crystal Surfaces using High Resolution Electron Diffraction
    Analytical and Bioanalytical Chemistry 379, 588–593 (2004)
    DOI: 10.1007/s00216-004-2547-8

  • Kury, Peter; Zahl, P.; Horn-von Hoegen, Michael; Voges, C.; Frischat, H.; Günter, H.-L.; Pfnür, H.; Henzler, M.
    Chopped Sample Heating for Quantitative Profile Analysis of Low Energy Electron Diffraction Spots at High Temperatures
    Rev. Sci. Instrum. 75, 4911–4915 (2004)
    DOI: 10.1063/1.1807003

  • Meyer zu Heringdorf, Frank; Belton, A.C.
    Flexible Microprocessor-Based Evaporation Controller
    Rev. Sci. Instrum. 75, 5288–5292 (2004)
    DOI: 10.1063/1.1818911

  • Kury, Peter; Horn-von Hoegen, Michael
    Impact of Thermal Dependence of Elastic Constants on Surface Stress Measurements
    Rev. Sci. Instrum. 75, 1357–1358 (2004)
    DOI: 10.1063/1.1711151

2003
 

  • Menzel, A.; Conrad, E.H.; Tringides, M.C.; Kammler, Martin; Horn-von Hoegen, Michael
    Finite Collection Time Effects in Autocovariance Function Measurements
    J. Appl. Phys. 93, 2229–2235 (2003)
    DOI: 10.1063/1.1537466

  • Horn-von Hoegen, Michael
    Ge on Si(001) - a Hetero Epitaxial Playground for Surface Science
    Surf. Sci. 537, 1-3 (2003)
    DOI: 10.1016/S0039-6028(03)00700-3/

  • K. Sokolowski-Tinten, C. Blome, J. Blums, A. Cavalleri, C. Dietrich, A. Tarasevitch, I. Uschmann, E. Förster, M. Kammler, M. Horn-von Hoegen, and D. von der Linde
    Femtosecond X-Ray Measurement of Coherent Lattice Vibrations near the Lindemann Stability Limit
    Nature 422, 287–289 (2003)
    Articles: nature01490

2002
 

  • Meyer zu Heringdorf, Frank; Hild, R.; Zahl, P.; Schmidt, Th.; Ressel, B.; Heun, S.; Bauer, E.; Horn-von Hoegen, Michael
    Erratum to: Local Au Coverage as Driving Force for Au Induced Faceting of Vicinal Si(001):a LEEM and XPEEM Study
    Surf. Sci. 496, 151 (2002)
    DOI: 10.1016/S0039-6028(01)01582-5

  • Hild, R.; Seifert, C.; Kammler, Martin; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael; Zachuk, R.; Olshanetsky, B. Z.
    Kinetics of Au Induced Faceting of Vicinal Si(111)
    Surf. Sci. 512, 117-127 (2002)
    DOI: 10.1016/S0039-6028(02)01666-7

  • Hild, R.; Kammler, Martin; Dumkow, I.; Horn-von Hoegen, Michael
    Self-organisation of Ge nanostructures on i(111): A SPA-LEED and STM Study,
    Omicron Newsletter 5, 2 (2002)

  • Kammler, Martin; Horn-von Hoegen, Michael; Voss, N.; Tringides, M.; Menzel, A.; Conrad, E.H.
    Si(001)Step Dynamics: A Temporal Low-Energy Electron Diffraction Study
    Phys. Rev. B 65, 075312 (2002)
    DOI: 10.1103/PhysRevB.65.075312

  • Tegenkamp, C.; Wollschläger, J.; Pfnür, H.; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Step and Kink Correlations on Vicinal Ge(100) Surfaces Investigated by Electron Diffraction
    Phys. Rev. B 65, 235316 (2002)
    ´DOI: 10.1103/PhysRevB.65.235316

  • Zahl, P.; Horn-von Hoegen, Michael
    Third-generation generation cone-shaped SPA-LEED
    Rev. Sci. Instrum. 73, 2958–2962 (2002)
    DOI: 10.1063/1.1489074

  • Sokolowski-Tinten, Klaus; Blome, C.; Dietrich, C.; Tarasevitch, Alexander; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, Andrea; Squier, J.A.; Kammler, Martin
    Time-Resolved X-Ray Diffraction Study of Ultrafast Structural Dynamics in Laser-Excited Solids
    Ultrafast Phenomena XIII 71, 36 (2002)
    DOI: 10.1364/UP.2002.MB2

2001
 

  • Seifert, C.; Hild, R.; Horn-von Hoegen, Michael; Zhachuk, R.A.; Olshanetsky, B.Z.
    Au Induced Reconstructions on Si(111)
    Surf. Sci. 488, 233-238 (2001)
    DOI: 10.1016/S0039-6028(01)01139-6

  • Yuhara, J.; Morita, K.; Falta, J.; Müller, B.H.; Horn-von Hoegen, Michael
    Characterization of Ge δ-Doped Si(111) with RBS-Channeling
    Surface and Interface Analysis 31, 754-760 (2001)
    DOI: 10.1002/sia.1106

  • Sokolowski-Tinten, Klaus; Blome, C.; Dietrich, C.; Tarasevitch, Alexander; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, Andrea; Squier, J.; Kammler, Martin
    Femtosecond X-Ray Measurement of Ultrafast Melting and Large Acoustic Transients
    Phys. Rev. Lett. 87, 225701 (2001)
    DOI: 10.1103/PhysRevLett.87.225701

  • Meyer zu Heringdorf, Frank; Hild, R.; Zahl, P.; Schmidt, Th.; Ressel, B.; Heun, S.; Bauer, E.; Horn-von Hoegen, Michael
    Local Au Coverage as Driving Force for Au Induced Faceting of Vicinal Si(001) : A LEEM and XPEEM Study
    Surf. Sci. 480, 103-108 (2001)
    DOI:ext: DOI: 10.1016/S0039-6028(01)00824-X

  • Meyer zu Heringdorf, Frank; Schmidt, Th.; Heun, S.; Hild, R.; Zahl, P.; Ressel, B.; Bauer, E.; Horn-von Hoegen, Michael
    Spatial Variation of Au Coverage as the Driving Force for Nanoscopic Pattern Formation
    Phys. Rev. Lett. 86, 5088 (2001)
    DOI: 10.1103/PhysRevLett.86.5088

  • Janzen, A.; Dumkow, I.; Horn-von Hoegen, Michael
    Thermal activation of dislocation array formation
    Appl. Phys. Lett. 79, 2387–2389 (2001)
    DOI: 10.1063/1.1408599

  • Sokolowski-Tinten, Klaus; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, Andrea; Siders, Craig W.; Brown, F.L.H.; Leitner, D.M.; Tóth, Csaba; Barty, Christopher P.P.; Squier, J.A.; Wilson, Kent R.; Kammler, Martin
    Transient Lattice Dynamics in fs-Laser-Excited Semiconductors Probed by Ultrafast X-Ray Diffraction
    J. Phys. IV France 11, Pr2-473-Pr2-477 (2001)
    DOI:ext: DOI: 10.1051/jp4:2001290

  • Cavalleri, Andrea; Siders, Craig W.; Rose-Petruck, Christoph G.; Jimenez, Ralph; Tóth, Csaba; Squier, J.A.; Barty, Christopher P.P.; Wilson, Kent R.; Sokolowski-Tinten, Klaus; Horn-von Hoegen, Michael; von der Linde, Dietrich
    Ultrafast X-Ray Measurement of Laser Heating in Semiconductors: Parameters Determining the Melting Threshold"
    Phys. Rev. B 63, 193306 (2001)
    DOI: 10.1103/PhysRevB.63.193306

2000
 

  • Cavalleri, Andrea; Siders, Craig W.; Brown, F.L.H.; Leitner, D.M.; Tóth, Csaba; Squier, J.A.; Barty, Christopher P.P.; Wilson, Kent R.; Sokolowski-Tinten, Klaus; Horn-von Hoegen, Michael; von der Linde, Dietrich; Kammler, Martin
    Anharmonic Lattice Dynamics in Germanium Measured with Ultrafast X-Ray Diffraction
    Phys. Rev. Lett. 85, 586 (2000)
    DOI: 10.1103/PhysRevLett.85.586

  • Hild, R.; Meyer zu Heringdorf, Frank; Zahl, P.; Horn-von Hoegen, Michael
    Au Induced Regular Ordered Striped Domain Wall Structure of a (5x3) Reconstruction on Si(001) Studied by STM and SPA-LEED
    Surf. Sci. 454–456, 851-855 (2000)
    : DOI: 10.1016/S0039-6028(00)00192-8

  • Minoda, H.; Shimakura, T.; Yagi, K.; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Formation of Hill and Valley Structures on Si(001) Vicinal Surfaces Studied by Spot-Profile-Analyzing LEED
    Phys. Rev. B 61, 5672 (2000)
    DOI: 10.1103/PhysRevB.61.5672

  • Meyer zu Heringdorf, Frank; Goldbach, H.; Guenter, H.L.; Horn-von Hoegen, Michael; Dorna, V.; Koehler, U.; Henzler, M.
    Hydrogen Induced Domain-Wall Structure on Si(113)
    Surf. Sci. 458, 147-154 (2000)
    DOI: 10.1016/S0039-6028(00)00434-9

  • Sokolowski-Tinten, Klaus; Cavalleri, Andrea; Siders, Craig W.; Brown, F.L.H.; Leitner, D.M.; Tóth, Csaba; Kammler, Martin; Horn-von Hoegen, Michael; von der Linde, Dietrich; Squier, J.A.; Barty, Christopher P.P.; Wilson, Kent R.
    Time-Resolved X-Ray Diffraction Study of Ultrafast Acoustic Phonon Dynamics in Ge/Si Heterostructures
    Ultrafast Phenomena XII 66, 281–283 (2000)
    DOI: 10.1007/978-3-642-56546-5_81

1999
 

  • Kammler, Martin; Schmidt, Th.; Zahl, P.; Kury, P.; Falta, J.; Horn-von Hoegen, Michael
    3-dim. Reciprocal Space mapping of a Quasi Periodic Misfit Dislocation Array
    HASYLAB/DESY Annual Report (1999)
    Report: part1/contrib/43/747

  • Meyer zu Heringdorf, Frank; Hild, R.; Zahl, P.; Horn-von Hoegen, Michael; Schmidt, Th.; Heun, S.; Ressel, B.; Bauer, E.
    Au Induced Giant Faceting of Vicinal Si(001)
    Elettra Highlights 98-99, 42-44 (1999)
    Document: SCIENCE/elettra_highlights_1998-1999

  • Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank; Hild, R.; Zahl, P.; Schmidt, Th.; Bauer, E.
    Au Induced Giant Faceting of Vicinal Si(001)
    Surf. Sci. 433-435, 475-480 (1999)
    DOI: 10.1016/S0039-6028(99)00459-8

  • Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank; Kammler, Martin; Schaeffer, C.; Reinking, Dirk; Hofmann, Karl R.
    Bi surfactant mediated epitaxy of Ge on Si(111)
    Thin Solid Films 343-344, 579-582 (1999)
    DOI: 10.1016/S0040-6090(98)01659-9

  • Siders, Craig W.; Cavalleri, Andrea; Sokolowski-Tinten, Klaus; Toth, Csabe; Guo, Ting; Kammler, Martin; Horn-von Hoegen, Michael; Wilson, Kent R.; von der Linde, Dietrich; Barty, Christopher P.P.
    Detection of Nonthermal Melting by Ultrafast X-Ray Diffraction
    Science 286, 1340-1342 (1999)
    DOI: 10.1126/science.286.5443.1340

  • Reinking, Dirk; Kammler, Martin; Hoffmann, N.; Horn-von Hoegen, Michael; Hofmann, Karl R.
    Fabrication of High-Mobility Ge p-Channel MOSFETs on Si Substrates
    Elec. Lett. 35, 503-504 (1999)
    DOI: 10.1049/el_19990349

  • Minoda, H.; Yagi, K.; Meyer zu Heringdorf, Frank; Meier, A.; Kähler, D.; Horn-von Hoegen, Michael
    Gold-Induced Faceting on a Si(001) Vicinal Surface: SPA-LEED and REM Study
    Phys. Rev. B 59, 2363-2375 (1999)
    DOI: 10.1103/PhysRevB.59.2363

  • Minoda, H.; Shimakura, T.; Yagi, K.; Meyer zu Heringdorf, Frank; Horn-von Hoegen, Michael
    Gold-Induced Faceting on a Si(hhm) Surface (m/h=1.4-1.5) Studied by SPA-LEED
    Surf. Sci. 432, 69 (1999)
    DOI: 10.1016/S0039-6028(99)00516-6

  • Horn-von Hoegen, Michael
    Growth of Semiconductor Layers Studied by Spot Profile Analysing Low Energy Electron Diffraction
    Zeitschrift für Kristallographie 214 , 591(1999)
    DOI: 10.1524/zkri.1999.214.10.591/html

  • Zahl, P.; Kury, Peter; Horn-von Hoegen, Michael
    Interplay of Surface Morphology and Strain Relief During Surfactant Mediated Epitaxy of Ge on Si
    Appl. Phys. A 69, 481-488 (1999)
    DOI: 10.1007/s003390051445

  • Horn-von Hoegen, Michael
    Spot Profile Analysis Low Energy Electron Diffraction of Semiconductor Growth
    Zeitschrift für Kristallographie 214, 591-629 and 684-721 (1999)
    DOI: 10.1524/zkri.1999.214.10.591

  • Kammler, Martin; Reinking, Dirk; Hofmann, Karl R.; Horn-von Hoegen, Michael
    Surfactant-Mediated Epitaxy of Ge on Si: Progress in Growth and Electrical Characterization
    Thin Solid Films 336, 29-33 (1999)
    DOI:: DOI: 10.1016/S0040-6090(98)01294-2

1998
 

  • Horn-von Hoegen, Michael; Meyer zu Heringdorf, Frank; Kähler, Dirk; Schmidt, Th.; Bauer, Ernst
    Adsorption Induced Giant Faceting of Vicinal Si(001)
    Thin Solid Films 336, 16-21 (1998)
    DOI: 10.1016/S0040-6090(98)01293-0

  • Meyer zu Heringdorf, Frank; Schmidt, Th.; Bauer, E.; Kähler, D.; Minoda, H.; Yagi, K.; Horn-von Hoegen, Michael
    Giant Faceting of Vicinal Si(001) Induced by Au Adsorption
    Surf. Rev. Lett. 5, 1167-1178 (1998)
    DOI: 10.1142/S0218625X9800150X

  • Falta, J.; Mielmann, O.; Schmidt, T.; Hille, A.; Sanchez-Hanke, C.; Sonntag, P.; Materlik, G.; Meyer zu Heringdorf, Frank; Kammler, Martin; Horn-von Hoegen, Michael; Copel, M.
    High Concentration Bi δ-Doping Layers on Si(001)
    Appl. Surf. Sci. 123/124, 538-541 (1998)
    DOI: 10.1016/S0169-4332(97)00566-7

  • Horn-von Hoegen, Michael; Minoda, H.; Yagi, H.; Meyer zu Heringdorf, Frank; Kähler, D.
    Macroscopic One-Dimensional Facetting of Si(100) Upon Au Adsorption
    Surf. Sci. 402-404, 464-469 (1998)
    DOI: 10.1016/S0039-6028(97)00989-8

  • Meier, A.; Zahl, P.; Vockenrodt, R.; Horn-von Hoegen, Michael
    Step Arrangement Control of Vicinal Si(001) by Ag Adsorption
    Appl. Surf. Sci. 123/124, 694-698 (1998)
    DOI: 10.1016/S0169-4332(97)00431-5

  • Kammler, Martin; Falta, J.; Kury, Peter; Müller, B.H.; Schmidt, T.; Horn-von Hoegen, Michael
    Strain Field of Periodic Dislocation Networks of SME grown Ge on Si(111)
    HASYLAB/DESY Annual Report 0 (1998)
    Report: 1998/part1/contrib/23/1422

  • Henzler, M.; Thielking, D.; Horn-von Hoegen, Michael; Zielasek, V
    Surface Morphology Changes Due to Adsorbates and Due to Electron Bombardement
    Physica A 261, 1-12 (1998)
    DOI: 10.1016/S0378-4371(98)00367-7

  • Hofmann, Karl R.; Reinking, Dirk; Kammler, Martin; Horn-von Hoegen, Michael
    Surfactant-Grown Low-Doped Germanium Layers on Silicon with High Electron Mobilities
    Thin Solid Films 321, 125-130 (1998)
    DOI: 10.1016/S0040-6090(98)00460-X

  • Falta, J.; Bahr, D.; Materlik, G.; Müller, B.H.; Horn-von Hoegen, Michael
    X-Ray Characterization of Buried δ Layers
    Surf. Rev. Lett. 5, 145-149 (1998)
    DOI: 10.1142/S0218625X98000281

1997
 

  • Fölsch, S.; Meyer, G.; Winau, D.; Rieder, K.H.; Horn-von Hoegen, Michael; Schmidt, T.; Henzler, M.
    Ag-Mediated Step-Bunching Instability on Vicinal Si(100)
    Surf. Sci. 394, 60-70 (1997)
    DOI: 10.1016/S0039-6028(97)00589-X

  • Reinking, Dirk; Kammler, Martin; Horn-von Hoegen, Michael; Hofmann, Karl R.
    Enhanced Sb Segregation in Surfactant-Mediated Heterogrowth: High-Mobility, Low-Doped Ge on Si
    Appl. Phys. Lett. 71, 924-926 (1997)

  • Reinking, Dirk; Kammler, Martin; Horn-von Hoegen, Michael; Hofmann, Karl R.
    High Electron Mobilities in Surfactant-Grown Germanium on Silicon Substrates
    Jap. J. Appl. Phys. 36, L1082 (1997)
    DOI: 10.1143/JJAP.36.L1082

1996
 

  • Horn-von Hoegen, Michael; Golla, Anke
    Adsorbate Induced Change of Equilibrium Surface During Crystal Growth: Si on Si(111)/H
    Phys. Rev. Lett. 76, 2953-2956 (1996)
    DOI: 10.1103/PhysRevLett.76.2953

  • Falta, J.; Bahr, D.; Hille, A.; Materlik, G.; Kammler, Martin; Horn-von Hoegen, Michael
    Stress Reduction and Interface Quality of Buried Sb δ-Layers on Si(001)
    Appl. Phys. Lett. 69, 2906-2908 (1996)
    DOI: 10.1063/1.117319

  • Falta, J.; Bahr, D.; Materlik, G.; Müller, B.H.; Horn-von Hoegen, Michael
    Towards Perfect Ge δ Layers on Si(001)
    Appl. Phys. Lett. 68, 1394-1396 (1996)
    Article: singlejournalindex/1512339

  • Bahr, D.; Falta, J.; Materlik, G.; Müller, B.H.; Horn-von Hoegen, Michael
    X-Ray Interface Characterization of Ge δ Layers on Si(001)
    Physica B 221, 96-100 (1996)
    DOI: 10.1016/0921-4526(95)00911-6

1995
 

  • Fölsch, S.; Winau, D.; Meyer, G.; Rieder, K.H.; Horn-von Hoegen, Michael; Schmidt, T.; Henzler, M.
    Ag-Induced Multi-Step Formation on Si(001)
    Appl. Phys. Lett. 67, 2185-2187 (1995)
    DOI: 10.1063/1.115097

  • Horn-von Hoegen, Michael; Schmidt, T.; Henzler, M.; Meyer, G.; Winau, D.; Rieder, K.H.;
    Epitaxial layer growth of Ag(111)-films on Si(100)
    Surf. Sci. 331-333, 575-579 (1995)
    DOI: 10.1016/0039-6028(95)00320-7

  • Falta, J.; Gog, T.; Materlik, G.; Müller, B.H.; Horn-von Hoegen, Michael
    Ge &delta-Layers on Si(111) and Si(001) Grown by MBE and SPE
    MRS Proceedings 375, 177-180 (1995)

  • Horn-von Hoegen, Michael; Golla, Anke
    Influence of H on Low Temperature Si(111) Homoepitaxy
    Surf. Sci. 337, L777-L782 (1995)
    DOI: 10.1016/0039-6028(95)80036-0

  • Falta, J.; Gog, T.; Materlik, G.; Müller, B.H.; Horn-von Hoegen, Michael
    Interface Roughening of Ge δ Layers on Si(111)
    Phys. Rev. B 51, 7598 (1995)
    DOI: 10.1103/PhysRevB.51.7598

  • Horn-von Hoegen, Michael; Schmidt, T.; Henzler, M.; Meyer, G.; Winau, D.; Rieder, K.H.
    Lattice accomodation of Si(001) and Ag(111)
    Phys. Rev. B 52, 10764-10767 (1995)
    DOI: 10.1103/PhysRevB.52.10764

  • Fölsch, S.; Meyer, G.; Winau, D.; Rieder, K.H.; Schmidt, T.; Horn-von Hoegen, Michael
    Reconstruction Dependent Orientation of Ag(111) Films on Si(001)
    Phys. Rev. B 52, 13745 (1995)
    DOI: 10.1103/PhysRevB.52.13745

  • Horn-von Hoegen, Michael; Falta, J.; Copel, M.; Tromp, R.M.
    Surfactants in Si(111) Homoepitaxy
    Appl. Phys. Lett. 66, 487-489 (1995)
    DOI: 10.1063/1.114065

  • Henzler, M.; Horn-von Hoegen, Michael; Köhler, U;
    Grundschritte der Epitaxie: Sichtbarmachung mit Elektronenbeugung und Rastertunnelmikroskopie
    Nova Acta Leopoldina 295, 31-51 (1995)

1994
 

  • Horn-von Hoegen, Michael; Pietsch, Holger
    Homoepitaxy of Si(111) is Surface Defect Mediated
    Surf. Sci. Lett. 321, L129-L136 (1994)
    DOI: 10.1016/0039-6028(94)90016-7

  • Horn-von Hoegen, Michael; Henzler, M.
    Lattice Matching Periodic Interfacial Dislocation Network in Surfactant-Mediated Growth of Ge on Si(111)
    Phys. Stat. solidi 146, 337-352 (1994)
    DOI: 10.1002/pssa.2211460129

  • Horn-von Hoegen, Michael; Müller, B.H.; Al Falou, A.
    Strain Relief by Micro Roughness in Surfactant Mediated Growth of Ge on Si(001)
    Phys. Rev. B 50, 11640-11652 (1994)
    DOI: 10.1103/PhysRevB.50.11640

  • Horn-von Hoegen, Michael; Copel, Matthew; Tsang, J.; Reuter, M.C.; Tromp, R.M.
    Surfactant-Mediated Growth of Ge on Si(111)
    Phys. Rev. B 50, 10811-10822 (1994)
    DOI: 10.1103/PhysRevB.50.10811

  • Horn-von Hoegen, Michael; Al Falou, A.; Müller, B.H.; Köhler, U.; Andersohn, L.; Dahlheimer, B.; Henzler, M.
    Surfactant-Stabilized Strained Ge Cones on Si(100)
    Phys. Rev. B 49, 2637-2650 (1994)
    DOI: 10.1103/PhysRevB.49.2637

  • Horn-von Hoegen, Michael
    Surfactants: Perfect Heteroepitaxy of Ge on Si(111)
    Appl. Phys. A 59, 503 (1994)
    DOI: 10.1007/BF00348268

1993
 

  • Horn-von Hoegen, Michael; Al Falou, A.; Pietsch, Holger; Müller, B.H.; Henzler, M.
    Formation of Interfacial Dislocation Network in Surfactant Mediated Growth of Ge on Si(111) Investigated by Spa-Leed : Part I
    Surf. Scie. 298, 29-42 (1993)
    DOI: 10.1016/0039-6028(93)90077-W

  • Horn-von Hoegen, Michael; Pook, M.; Al Falou, A.; Müller, B.H.; Henzler, M.
    Surface Morphology and Strain Relief in Surfactant Mediated Growth of Ge on Si(111)
    Scanning Microscopy 7, 481-488 (1993)
    DOI: 10.1016/0039-6028(93)90524-N

  • Horn-von Hoegen, Michael; Müller, B.H.; Al Falou, A.; Henzler, M.
    Surfactant Induced Reversible Changes of Surface Morphology
    Phys. Rev. Lett. 71, 3170-3173 (1993)
    DOI: 10.1103/PhysRevLett.71.3170

  • Horn-von Hoegen, Michael; Pook, M.; Al Falou, A.; Müller, B.H.; Henzler, M.
    The Interplay of Surface Morphology and Strain Relief in Surfactant Mediated Growth of Ge on Si(111)
    Surf. Sci. 284, 53-66 (1993)
    DOI): 10.1016/0039-6028(93)90524-N

1992
 

  • Henzler, M.; Horn-von Hoegen, Michael; Köhler, U.
    Growth of Monoatomic Layers: Investigations with Electron Diffraction and Scanning Tunneling Microscopy
    Advances in Solid State Physics 32, 333 (1992)
    DOI: 10.1007/BFb0108637

  • Köhler, U.; Jusko, O.; Müller, B.; Horn-von Hoegen, Michael; Pook, M.
    Layer-by -Layer Growth of Germanium on Si(100): Strain Induced Morphology and the Influence of Surfactants
    Ultramicroscopy 42–44, 832 (1992)
    DOI: 10.1016/0304-3991(92)90365-Q

1991
 

  • Tromp, R.M.; Copel, Matthew; Reuter, M.C.; Horn-von Hoegen, Michael; Speidell, J.
    A New Two-Dimensional Particle Detector for a Toroidal Electrostatic Analyzer
    Rev. Sci. Instrum. 62, 2679 (1991)
    DOI: 10.1063/1.1142199

  • Horn-von Hoegen, Michael; LeGoues, F.K.; Copel, Matthew; Reuter, M.C.; Tromp, R.M.
    Defect Self-Annihilation in Surfactant-Mediated Epitaxial Growth
    Phys. Rev. Lett. 67, 1130 (1991)
    DOI: 10.1103/PhysRevLett.67.1130

  • LeGoues, F.K.; Horn-von Hoegen, Michael; Copel, Matthew; Tromp, R.M.
    Strain-Relief Mechanism in Surfactant-Grown Epitaxial Germanium Films on Si(111)
    Phys. Rev. B 44, 12894-12902 (1991)
    DOI: 10.1103/PhysRevB.44.12894

1990
 

  • Copel, Matthew; Reuter, M.C.; Horn-von Hoegen, Michael; Tromp, R.M.
    Influence of Surfactants in Ge and Si Epitaxy on Si(001),
    Phys. Rev. B 42, 11682 (1990)
    DOI: 10.1103/PhysRevB.42.11682

1989
 

  • Falta, J.; Horn, Michael; Henzler, M.
    SPA-LEED Studies of Defects in Thin Epitaxial NiSi2 Layers on Si(111)
    Appl. Surf. Sci. 41–42, 230 (1989)
    DOI: 10.1016/0169-4332(89)90062-7

  • Horn-von Hoegen, Michael; Falta, J.; Henzler, M.
    The Initial Stages of Growth of Silicon on Si(111) by Spot Profile Analysing Low-Energy Electron Diffraction
    Thin Solid Films 183, 213 (1989)
    DOI: 10.1016/0040-6090(89)90446-X

1988
 

  • Altsinger, R.; Busch, H.; Horn, Michael; Henzler, M.;
    Nucleation and Growth During Molecular Beam Epitaxy (MBE) of Si on Si(111)
    Surf. Sci. 200, 235-246 (1988)
    DOI: 10.1016/0039-6028(88)90524-9

  • Horn, Michael; Gotter, U.; Henzler, M.
    Low-Energy Electron Diffraction Investigations of Si Molecular-Beam Epitaxy on Si(100)
    Thin Solid Films 2, 727-730 (1988)
    DOI: 10.1016/0040-6090(89)90446-X