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Dr. Lars Breuer
AG Schleberger; MC 369
Experimentalphysik
Universität Duisburg-Essen
Lotharstraße 1
47057 Duisburg

Tel.: 0203 379-1602

lars.breuer[at]uni-due.de

• Y. Yao, A. Kononov, A. Metzlaff, A. Wucher, L. Kalkhoff, L. Breuer, M. Schleberger and A. Schleife
  Non-equilibrium dynamics of electron emission from cold and hot graphene under proton irradiation
  arXiv
• L. Kalkhoff, S. Matschy, A.S. Meyer, L. Lasnig, N. Junker, M. Mittendorff, L. Breuer and M. Schleberger
  Ultra-large polymer-free suspended graphene films
  arXiv
• P. Kucharczyk, A. Golombek, M. Schleberger, A. Wucher and L. Breuer
  Ultrashort Ne⁺ Ion Pulses for Use in Pump-Probe Experiments: Numerical Simulations
  New J. Phys., 25 (2023) 123015; Original Publication
• L. Kalkhoff, A. Golombek, M. Schleberger, K. Sokolowski-Tinten, A. Wucher, and L. Breuer
  Path to ion-based pump-probe experiments: Generation of 18 picosecond keV Ne⁺ ion pulses from a cooled supersonic gas beam
  Phys. Rev. Research, 5 (2023) 033106; Original Publication
• L. Skopinski, S. Kretschmer, P. Ernst, M. Herder, L. Madauß, L. Breuer, A.V. Krasheninnikov and M. Schleberger
  Velocity distributions of particles sputtered from supported two-dimensional MoS₂ during highly charged ion irradiation
  Phys. Rev. B, 107 (2023) 075418; Original Publication

• A. Golombek, L. Breuer, L. Danzig, P. Kucharczyk, M. Schleberger, K. Sokolowski-Tinten and A. Wucher
  Generation of ultrashort keV Ar⁺ ion pulses via femtosecond laser photoionization
  New J. Phys., 23 (2021) 033023; Original Publication
• E. Pollmann, S. Sleziona, T. Foller, U. Hagmann, C. Gorynksi, O. Petri, L. Madauss, L. Breuer and M. Schleberger
  Large-Area, Two-Dimensional MoS2 Exfoliated on Gold: Direct Experimental Access to the Metal-Semiconductor Interface
  ACS Omega, 6 (2021) 15929–15939; Original Publication

• L. Breuer, P. Ernst, M. Herder, F. Meinerzhagen, M. Bender, D. Severin and A. Wucher
  Mass spectrometric investigation of material sputtered under swift heavy ion bombardment
  Nucl. Instrum. Meth. B, 435 (2020) 101–110; Original Publication
• L. Madauss, E. Pollmann, T. Foller, J. Schumacher, U. Hagemann, T. Heckhoff, M. Herder, L. Skopinski, L. Breuer, A. Hierzenberger, A. Wittmar, H. Lebius, A. Benyagoub, M. Ulbricht, R. Joshi and M. Schleberger
  A swift technique to hydrophobize graphene and increase its mechanical stability and charge carrier density
  npj 2D Mater. Appl., 4 (2020) 11; Original Publication

• L. Breuer, H. Tian, A. Wucher and N. Winograd
  Molecular SIMS Ionization Probability Studied with Laser Postionization: Influence of the Projectile Cluster
  J. Phys. Chem. C, 121 (2019) 565–574; Original Publication
• T. Pinot, M. Chabot, K. Beroff, M. Godard, F. Fernandez-Villora, K. C. Lei, L. Breuer, M. Herder, A. Wucher, M. Bender, D. Severin, C. Trautmann and E. Dartois
  Release of large polycyclic aromatic hydrocarbons and fullerenes by cosmic rays from interstellar dust Swift heavy ion irradiations of interstellar carbonaceous dust analogue
  Astron. Astrophys., 623 (2019) 6; Original Publication
• A. Wucher, L. Breuer and N. Winograd
  Ionization probability of sputtered indium under irradiation with 20-keV fullerene and argon gas cluster projectiles
  Int. J. Mass Spectrom., 438 (2019) 13-21; Original Publication

• L. Breuer, P. Ernst, M. Herder, F. Meinerzhagen, M. Bender, D. Severin and A. Wucher
  Secondary ion formation during electronic and nuclear sputtering of germanium
  Nucl. Instrum. Meth. B, 424 (2018) 1-9; Original Publication
• M. Herder, P. Ernst, L. Breuer, M. Bender, D. Severin and A. Wucher
  Secondary ion formation on indium under nuclear and electronic sputtering conditions
  J. Vac. Sci. Technol. B., 36 (2018); Original Publication

• NJ. Popczun, L. Breuer, A. Wucher and N. Winograd
  Ionization Probability in Molecular Secondary Ion Mass Spectrometry: Protonation Efficiency of Sputtered Guanine Molecules Studied by Laser Postionization
  J. Phys. Chem. C, 121 (2017) 15929; Original Publication
• NJ. Popczun, L. Breuer, A. Wucher and N. Winograd
  On the SIMS Ionization Probability of Organic Molecules
  J. Am. Soc. Mass Spectrom., 28 (2017) 1182–1191; Original Publication
• L. Breuer, NJ. Popczun, A. Wucher and N. Winograd
  Reducing the Matrix Effect in Molecular Secondary Ion Mass Spectrometry by Laser Post-Ionization
  J. Phys. Chem. C, 121 (2017) 19705-19715; Original Publication
• N. J. Popczun, L. Breuer, A. Wucher and N. Winograd
  Mass spectrometric investigation of material sputtered under swift heavy ion bombardment
  Nucl. Instrum. Meth. B, 435 (2017) 101-110; Original Publication
• L. Breuer, P. Ernst, M. Herder, F. Meinerzhagen, M. Bender, D. Severin and A. Wucher
  Effect of SIMS ionization probability on depth resolution for organic/inorganic interfaces
  Surf. Interface Anal., 49 (2017) 933-939; Original Publication

• L. Breuer, F. Meinerzhagen, M. Herder, M. Bender, D. Severin, JO. Lerach and A. Wucher
  Secondary ion and neutral mass spectrometry with swift heavy ions: Organic molecules
  J. Vac. Sci. Technol. B, 34 (2016) 3; Original Publication

• F. Meinerzhagen, L. Breuer, H. Bukowska, M. Bender, D. Severin, M. Herder, H. Lebius, M. Schleberger and A. Wucher
  A new setup for the investigation of swift heavy ion induced particle emission and surface modifications
  Rev. Sci. Instrum., 87 (2016) 013903; Original Publication

• L. Breuer, F. Meinerzhagen, M. Bender, D. Severin and A. Wucher
  Time-of-Flight Secondary & Ion Mass Spectrometry Using Swift Heavy Ions
  Nucl. Instrum. Meth. B , 365 (2015) 482–489; Original Publication

• L. Breuer, A. Kucher, M. Herder, A. Wucher and N. Winograd
  Formation of Neutral InmCn Clusters under C-60 Ion Bombardment of Indium
  J. Phys. Chem. A, 118 (2014) 8542–8552; Original Publication

APPA Meeting - Darmstadt, Germany
Talk: Status of optical and mass spectroscopy at CRYRING and M-Branch

7^th International  Conference on Nanostructuring by Ion Beams - Dehradun, India
Invited Talk: MeV-SIMS/SNMS: probing material emission with swift heavy ion projectiles

24^th International Workshop on Inelastic Ion-Surface Collisions - Charleston, SC, USA
Invited Talk: On the Path to Ion Based Pump-Probe Experiments: Development and Applications of a Novel ps-Ion Source

23^rd International Workshop on Inelastic Ion-Surface Collisions - Matsue, Japan
Invited Talk: Molecular Secondary Neutral Mass Spectrometry by Laser Post-Ionization

22^nd International Conference on Secondary Ion Mass Spectrometry - Kyoto, Japan

20^th International Conference on Radiation Effects in Insulators - Nur-Sultan, Kazakhstan
Invited Talk: GeV SIMS/SNMS studies of nonmetallic materials

5^th International Conference on Ion Beams in Materials, Engineering and Characterization - New Delhi, India
Invited Talk: Secondary Ion and Neutral Mass Spectrometry with Swift Heavy Ions

The 23^rd International Conference on Ion Beam Analysis - Shanghai, China 
Invited Talk: MeV-SIMS/SNMS, secondary ion and neutral mass spectrometry at very high energies

21^st International Conference on Secondary Ion Mass Spectrometry - Krakow, Poland 
Talk, Poster:Imaging with IR strong-field post-ionization; Secondary Neutral Mass Spectrometry with MeV and keV projectiles

Ion-Surface Interactions 2017 (ISI) - Moscow, Russia 
Invited Talk: Mass Spectrometry on Sputtered Neutral Material with keV to GeV Projectiles

AVS 63^rd International Symposium and Exhibition - Nashville, Tennesse, USA 
Talk: Reducing Matrix Effects in Organic Secondary Ion Mass Spectrometry

25^th Conference on Application of Accelerators in Research and Industry (Caari) - Fort Worth, Texas, USA 
Invited Talk: MeV-ToF-SIMS/SNMS: Accessing the Sputtered Neutral Material

SIMS XX - 20^thth Internation Confernce on Secondary Ion Mass Spectrometry - Seatle, Washington, USA 
Poster: SIMS and SNMS with Swift Heavy Ions

SIMS XX - 20^th Internation Confernce on Secondary Ion Mass Spectrometry - Seatle, Washington, USA 
Talk: Molecular Depth Profiling with Strong Field Post - Ionizatin

Workshop Ionenstrahlen & Nanostrukturen - Paderborn, Germany 

SIMS XVIII - 18^th International Conference on Secondary Ion Mass Spectrometry - Riva del Garda, Italy 
Poster: Post-ionization of sputtered particles by tunable VUV-radiation