Transmission Electron Microscopy
Interdisplinary Center for Analytics at the Nanoscale (ICAN) Transmission Electron Microscopy
We offer crystallographic, chemical and morphological analysis for various materials by means of high-resolution and analytical transmission electron microscopy.
Si spheres (FIB lamella): diffraction and HRTEM
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(left) TEM image of FIB lamella sample containig cross-section of three Si spheres (1,2,3) with corresponding single-crystal diffraction patterns.
(right) TEM image of Si sphere "3" and high resolution image of the area marked with the blue square.
(Sample: courtesy of Martin Meseth, TEM measurements: Anna Elsukova)
Co-Cr-Mo alloy: EDX map
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HAADF-STEM image of the Co-Cr-Mo alloy with corresponding elemental maps of characteristic x-ray Co, Cr and Mo K-lines. EDX maps were acquired from the region marked by an orange square.
(Sample: courtesy of Priska Stemmer ,TEM measurements: Anna Elsukova)
Fe@Au core shell nanoparticle: EDX map
(click on the picture to enlarge)
HAADF-STEM image of the Fe@Au nanoparticle with corresponding elemental maps of characteristic x-ray Fe K-line and Au M-line. EDX maps were acquired from the region marked by an orange square.
(Sample: courtesy of Jurij Jakobi, TEM measurements: Anna Elsukova)
Service request
Please, fill out the form (Microsoft Word 2010) regarding service investigations and contact Ms.Grubba.
Service request form: Microsoft Word 97-2003 version
DFG Förderung
Die Deutsche Forschungsgemeinschaft fördert in Sachmittelprojekten die Nutzung eines TEMs mit bis zu 200 € / h pauschal.
Note: TEM requires very thin samples (typical thickness < 50 nm, maximum thickness 100 nm), so preparation of such samples is required to conduct the measurements.