• S. Vinaji, A. Lochthofen, W. Mertin, G. Bacher^, I. Regolin, K. Blekker, W. Prost, F.-J. Tegude
  "Kelvin probe force microscopy as a tool for the characterization of single semiconductor nanowires"
  3^rd Nanowire Growth Worshop 2008, 15. – 16.09.2008, Duisburg

• S. Vinaji, A. Lochthofen, W. Mertin, G. Bacher^, I. Regolin, K. Blekker, W. Prost, F.-J. Tegude
  "Local electrical analysis of a single semiconductor nanowire by Kelvin probe force microscopy"
  29^th Intern. Conf. on the Physics of Semiconductors ICPS, 27.7. – 1.8.2008, Rio de Janeiro, Braz.

• A. Lochthofen, W. Mertin, G. Bacher, L. Hoeppel, S. Bader, J. Off, and B. Hahn
  "Electrical activity of V-defects in GaN probed by Kelvin force and conductive atomic force microscopy"
  2008 Electronic Materials Conference EMC, 25.-27 Juni 2008, Santa Babara, CA

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