• L. Yan, Ch. Punckt, I. A. Aksay, W. Mertin, G. Bacher
  "Potential distribution in functionalized graphenedevices probed by Kelvin probe force microscopy"
  30th International Conference on the Physics of Semiconductors (ICPS 2010), Seoul, Korea, 25. – 30. July 2010

• L. Yan, S. Vinaji, C. Punckt, I. A. Aksay, H. Bukowska, M. Schleberger, G. Bacher, W. Mertin
  "Local work function of defective graphene probed by Kelvin Probe Force Microscopy"
  DPG Frühjahrstagung der Sektion Kondensierte Materie (SKM) Regensburg, 21. - 26. März 2010

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