earlier

1995

later

• Th. Kauffeldt, H. Lakner, M. Lohmann, A. Schmitt-Ott:
  "Nanocharacterization of small particles produced in a gas"
  Journal of NanoStructured Materials, Vol. 6 (1995) 365-368

 

• G. David, D. Jäger, E. Kubalek, W. Mertin (eingeladene Veröffentlichung):
  "Der Blick ins Innere der Mikrowellenschaltung. Neue Verfahren in der elektrooptischen Messtechnik"
  in: forschung, Mitteilungen der DFG 1/95, 22-24

 

• M. Batinic, D. Begert, E. Kubalek:
  "Pulsed electron beam generation via laser stimulation"
  Nuclear Instruments and Methods in Physics Research A 363 (1995) 43-47

 

• J. Sprengepiel, C. Böhm, E. Kubalek:
  "Electric Force Microscope Probing inside the Intel Pentium-Micro Processor"
  Proc. 21th ESSCIRC '95, Lille, Frankreich (1995) 270-273

 

• C. Böhm, J. Sprengepiel, A. Leyk, E. Kubalek:
  "Characterisation of probe-tip/sample signal transmission in electrical sampling scanning force microscopy"
  Proc. 25th European Microwave Conference (EMC), Bologna, Italien (1995) 1265-1269

 

• W. Prost, F. Scheffer, Q. Liu, A. Lindner, H. Lakner, I. Gyuro, F.J. Tegude:
  "Metalorganic vapor phase epitaxial grown heterointerfaces to GaInP with group-III and group-V exchange"
  Journal of Crystal Growth 146 (1995) 538-543

 

• C. Böhm, J. Sprengepiel, E. Kubalek:
  "Voltage contrast studies on 0.5 m integrated circuits by scanning force microscopy"
  Quality and Reliability Engineering International, Vol. 11 (1995) 253-256

 

• W. Mertin, C. Böhm, E. Kubalek:
  "Verfahren zur topografischen und/oder elektrischen Untersuchung von miniaturisierten Bauelementen"
  Proc. Micro Materials, Berlin (1995) 130-138

 

• A. Leyk, C. Böhm, D.W. van der Weide, E. Kubalek:
  "104 GHz signals measured by high frequency scanning force microscope test system"
  Electronic Letters Vol. 31 No. 13 (1995) 1046-1047

 

• H. Lakner, J.Stammen, Q. Liu, W. Prost:
  "Characterization of highly strained Ga_0.5In _0.5P/InP interfaces"
  Inst. Phys. Conf. Ser. No. 146 (1995) 257-262

 

• H. Lakner, S. Ungerechts, E. Kubalek:
  "Quantitative convergent beam electron diffraction (CBED) from III-V semiconductor heterostructures and interfaces with nanoscale spatial resolution"
  Inst. Phys Conf. Ser. No. 146 (1995) 267-272

 

• H Lakner, S. Ungerechts, E. Kubalek:
  "CBED from semiconductor heterostructures using (coherent) subnanometer electron probes"
  Beitr. Elektronenmikroskop. Direktabb. Oberfl. 28 (1995) 85-90

 

• B. Bollig, E. Kubalek:
  "Atomic stacking dependence of the image contrast in simulated STEM Z-contrast images of ternary zincblende semiconductors"
  Beitr. Elektronenmikroskop. Direktabb. Oberfl. 28 (1995) 91-96

 

• J. Söllner, J. Schmoranzer, H. Hamadeh, B. Bollig, E.Kubalek, M. Heuken:
  "ZnMgSSe/ZnSSe/ZnSe-Heterostructures Grown by Metalorganic Vapor Phase Epitaxy"
  Journal of Electronic Materials, Vol. 24, No. 11 (1995) 1557-1561

 

• A. Leyk, E. Kubalek:
  "MMIC internal electric field mapping with submicrometre spatial resolution and gigahertz bandwidth by means of high frequency scanning force microscope testing"
  Electronics Letters, Vol. 31, No. 24 (1995) 2089-2091

 

• G. David, D. Jäger, E. Kubalek, W. Mertin:
  "Looking into the Interior of the Microwave Circuit. Novel Techniques in Electro-optical Sampling"
  Reports of the DFG 1995, german research, 17-19

 

• C. Böhm, J. Sprengepiel, E. Kubalek:
  "Scanning Probe Microscope Gigahertz Measurements on 200 Nanometer Wave Guides"
  Scanning Microscopy, Vol. 9, No. 4 (1995) 965-968

 

• G.Bacher, M. Illing, A.Forchel, D. Hommel, B. Jobst, G.Landwehr
  "Deep etched ZnSe-based nanostructures for future optoelectronic applications"
  phys. stat. sol. (b) 187, pp. 371 -377, (1995)

 

• G.Bacher, D.Tönnies, D. Eisert, A.Forchel, A.Waag, Th. Litz, G.Landwehr
  "Lateral bandgap modulation in CdTe/CdMgTe heterostructures by selective ion implantation"
  Materials Science Forum 182 - 184, pp. 187 -190, (1995)

 

• M.Illing, G.Bacher, A.Forchel, Th. Litz, A.Waag, G.Landwehr
  "Photoluminescence efficiency study of wet chemically etched CdTe/Cd_1-xMg_xTe wires"
  Applied Physics Letters 66 (14), pp. 1815 -1817, (1995)

 

• J.P. Reithmaier, A. Orth, D. Eisert, G. Bacher, A. Forchel
  "Focused ion beam patterning for optoelectronic devices based on III-V and II-VI semiconductors"
  Proceedings International Symposium "Nanostructures: Physics and Technology "; St. Petersburg, Russia, pp. 321 - 326, (1995)

 

• M.Illing, G.Bacher, A.Forchel, D. Hommel, B. Jobst, G.Landwehr
  "First order distributed feedback operation in ZnSe based laser structures"
  Applied Physics Letters 67 (1), pp. 1 -3, (1995)

 

• M.Illing, G.Bacher, T. Kümmell, T.G. Andersson, A.Forchel, D. Hommel, B. Jobst, G.Landwehr
  "Lateral quantization in deep etched CdZnSe / ZnSe quantum dots and quantum wires"
  Applied Physics Letters 67 (1), pp. 124 - 126, (1995)

 

• R. Spiegel, G.Bacher, K. Herz, M.Illing, T. Kümmell, A.Forchel, B. Jobst, D.Hommel, G.Landwehr
  "Recombination in deep etched CdZnSe/ZnSe quantum wires"
  Il Nuovo Cimento 17D, pp. 1729 - 1733, (1995)

 

• G.Bacher, C.Hartmann, H.Schweizer, H.Nickel
  "Modulated energy relaxation of photoexcited carriers into the excitonic ground state in shallow In_xGa_1-xAs/GaAs quantum wells"
  Solid State Communicatons 95 (1), pp. 15 - 19, (1995)

 

• S. Weber, W. Limmer, K. Thonke, R. Sauer, K. Panzlaff, G.Bacher, H.P. Meier, P. Roentgen
  "Thermal carrier emission from a semiconductor quantum well"
  Physical Review B 52 (20), pp. 14739 - 14747, (1995)

 

• M.Illing, G.Bacher, T. Kümmell, A.Forchel, D. Hommel, B. Jobst, G.Landwehr
  "Fabrication of CdZnSe / ZnSe quantum dots and quantum wires by electron beam lithography and wet chemical etching"
  Journal of Vacuum Science and Technology B13 (6), pp. 2792 -2796, (1995)

 

• G. Bacher, N. Mais, M. Illing, A. Forchel, K. Schüll, J. Nürnberger, G.Landwehr
  "ZnSe-based DBR laser diode"
  Electronics Letters 31 (25), pp. 2184 - 2185, (1995)

earlier      later

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