earlier

1999

later

• Q. Liu, H. Lakner, C. Mendorf, E. Kubalek, W. Taudt, M. Heuken, K. Heime:
  "Structural properties of MOVPE-grown ZnSe studied by X-ray diffractometry, atomic force microscopy and electron microscopy"
  Journal of Crystal Growth 197 (1999) 507-512

 

• H. Lakner, B. Rafferty, G. Brockt:
  "Electronic structure analysis of (In, Ga, Al) N heterostructures on the nanometre scale using EELS "
  Journal of Microscopy, Vol. 194 (1999) 79-83

 

• J. Bangert and E. Kubalek:
  "Digital Signal Measurements with Electric Force Microscope-Testing"
  Surf. Interface Anal. 27 (1999) 307-311

 

• S. Li, E. Kubalek, Y.Yin, F. Jiang, Q. Yin:
  "Study of overgrowth heterostructure InSb/GaAs by scanning electron acoustic microscopy"
  to be published in: Journal of Materials Science 34 (1999) 2561-2564

 

• G. Brockt, H. Lakner:
  "Probing the local dielectric/optical properties of group III-nitrides by spatially resolved EELS on the nanometer scale"
  Materials Science and Engineering B59 (1999) 155-158

 

• G. Brockt, H. Lakner:
  "EELS characterization of electronic structure in group III- nitrides compared with synchrotron ellipsometry results"
  Microscopy & Analysis 99, Vol. 5, Suppl. 2: Proceedings, Portland/Oregon, USA (1999) 692-693

 

• H. Lakner (eingeladene Veröffentlichung), F. Schulze-Kraasch, C. Mendorf, G. Brockt:
  "CBED investigations of mesoscopic semiconductor structures"
  Microscopy & Analysis 99, Vol. 5, Suppl. 2: Proceedings, Portland/Oregon, USA (1999) 208-209

 

• W. Mertin, J. Bangert, A. Klein, U. Behnke, V. Wittpahl, E. Kubalek (eingeladene Veröffentlichung):
  "Messung elektrischer Signale in Mikrobauteilen mit dem Rastersondenmikroskop"
  MP Materialprüfung Jahrg. 41 (1999) 10, 414-417

 

• S. Bae, K. Schiemann, W. Mertin, E. Kubalek, M. Maywald:
  "A new bifunctional topography and current probe scanning force microscopy testing of integrated circuits"
  Microelectronics Reliability 39 (1999) 975-980

 

• V. Wittpahl, C. Ney, W. Mertin, E. Kubalek:
  "Quantitative high frequency electric force microscope testing of monolithic microwave integrated circuits at 20 GHz"
  Microelectronics Reliability 39 (1999) 951-956

 

• U. Behnke, W. Mertin, E. Kubalek:
  "Voltage contrast measurements on quarter-micron and deep sub-micrometer structures with an electric force microscope based test system"
  Microelectronics Reliability 39 (1999) 969-974

 

• H. Lakner, C. Mendorf, G. Brockt:
  "Analyse der kristallinen und elektronischen Eigenschaften von Halbleiter-Nanostrukturen im Feldemissions-STEM"
  29. Tagung der Deutschen Gesellschaft für Elektronenmikroskopie, Dortmund
  OPTIK Int. Journal for Light and Electron Optics, Vol. 110, Suppl.8 (1999) 24

 

• J. Off, F. Scholz, E. Fehrenbacher, O. Gfrörer, A. Hangleiter, G. Brockt, H. Lakner:
  "Investigations on the V-Defect Formation in GaInN-GaN Multi Quantum Well Structures"
  Physica status solidi (b) 216 (1999) 529

 

• G. Brockt, H. Lakner, E. Kubalek:
  "Spatially resolved low-loss EELS analysis of optical properties of GaN and related alloys"
  Inst. Phys. Conf. Ser. No 164 (1999) 353-356

 

• C. Mendorf, F. Schulze-Kraasch, S. Li, X.G. Xu, C. Giesen, K. Heime, E. Kubalek:
  "Microcharacterisation of MOVPE-grown AlAsSb/GaAsSb superlattices by STEM"
  Inst. Phys. Conf. Ser. No 164 (1999) 189-192

 

• G. Bacher, D. Eisert, T. Kümmell, A. Forchel, M. Kühnelt, H.P. Wagner, G.Landwehr
  "Implantation Induced Changes in II-VI Semiconductor Heterostructures"
  Proc. 15th Int. Conf. on the Application of Accelerators in Research and Industry, Denton, Texas, USA, 4. - 7. November 1998, AIP Conference Proceedings 475,pp. 814 - 817 (1999)

 

• K. Herz, G. Bacher, A. Forchel, H. Straub, G. Brunthaler, W. Faschinger,G.Bauer, C. Vieu
  "Recombination dynamics in dry etched CdZnSe/ZnSe nanostructures: influence of exciton localization"
  Physical Review B 59, pp. 2888 - 2893 (1999)

 

• V.D. Kulakovskii, G. Bacher, R. Weigand, T. Kümmell, E. Borovitskaya, K. Leonardi, D. Hommel
  "Fine Structure of Biexciton Emission in Symmetric and Asymmetric CdSe/ZnSe Single Quantum Dots"
  Physical Review Letters 82, pp. 1780 - 1783 (1999)

 

• M. Legge, G. Bacher, A. Forchel, M. Klude, M. Fehrer, D. Hommel
  "Green emitting DFB laser diodes based on ZnSe"
  Electronics Letters 35, pp. 718-720 (1999)

 

• G. Bacher, T. Kümmell, D. Eisert, A. Forchel, B. König, W. Ossau, G. Landwehr
  "Buried single CdTe/CdMnTe quantum dots realized by focused ion beam lithography"
  Applied Physics Letters 75, pp. 956 - 958 (1999)

 

• G. Bacher, R. Weigand, J. Seufert, V.D. Kulakovskii, N.A. Gippius, A. Forchel, K. Leonardi, D. Hommel
  "Biexciton versus exciton lifetime in a single semiconductor quantum dot"
  Physical Review Letters 83, pp. 4417 - 4420 (1999)

 

• F. Gindele, K. Hild, W. Langbein, U. Woggon, K. Leonardi, D. Hommel, T. Kümmell, G. Bacher, A. Forchel
  "Phonon interaction of single excitons in CdSe/ZnSe quantum dot structures"
  Journal of Luminescence 83-84, 305 - 308 (1999)

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