RefDex is a simulation tool for calculating the complex refractive index (n + ik) of thin films. Our motivation is to tackle "problem" samples, ones with rough surfaces, inhomogineities, etc.

Brief Overview

• Uses reflection/transmission or ellipsometry measurements
• Simulations via the transfer matrix method
• "Model Free" method, no model for the refractive index is assumed
• Rough surfaces taken into account with scalar scattering theory
• Inhomogeneous layers implemented through novel methods
• More information: RefDex Presentation and RefDex Manual

Terms of use

• A version for non-commercial user and for commercial user is available.
• When publishing results produced in wholey or in part by the use of RefDex, one of the following references should be cited as stipulated by the licence agreement ( de , en ):
  • P. Manley, G. Yin, M. Schmid “A method for calculating the complex refractive index of inhomogeneous thin films” Journal of Physics D: Applied Physics 47(20), 205301 (2014)
  • G. Yin, P. Manley, M. Schmid “Influence of substrate and its temperature on the optical constants of CuIn_1-xGa_xSe₂ thin films” Journal of Physics D: Applied Physics 47(13), 135101 (2014)
  • G. Yin, C. Merschjann, M. Schmid “The effect of surface roughness on the determination of optical constants of CuInSe and CuGaSe thin films” Journal of Applied Physics 113, 213510 (2013)

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