The Cross Section Polisher is used for the preparation of cross sections for REM- EPMA- and SAM measurements. Any hard or soft samples, as well as compsites materials, are formed with minimal damage and the result is a smooth surface on nearly any metal, ceramic, glas, paper or synthetic material.

An argon beam polishes cross sections on a large, 1mm², area. The grazing incident angle minimizes  Ar contamination. The sample can be partially protected from the Ar beam using a shadow mask system.

An embedding of the sample is usually not necessary.