Methods for analysis
We offer you the following analytical methods:
Size, morphology & topography
- Analytical ultra-/ disc centrifuge (AUC / ADC)
- Optical micrsocope (LM)
- Profilometry
- 3D optical profilometer
- Scanning electron microscopy (SEM)
- Atomic force microscopy (AFM)
- Transmission electron microscopy (TEM)
Crystal structure & defects
Chemical structure & composition
- Analytical ultra-/ disc centrifuge (AUC / ADC)
- Energy dispersive X-ray analysis (EDX)
- Electron energy loss spectroscopy (EELS)
- Time of Flight - secondary ion mass spectroscopy (TOF-SIMS)
- X-ray photoelectron spectroscopy (XPS)
- Raman spectroscopy / microscopy
- Scanning augerelectron microscopy (SAM)
- Thermogravimetric analysis (TGA)
Electronic structure
- Electron energy loss spectroscopy (EELS)
- Ultraviolet photoelectron spectroscopy (UPS)
- Scanning probe microscopy (SPM)
Physical & chemical properties
Scanning probe microscopy (SPM)
Technical sheets of the large machines
The data sheets give a quick overview of the areas of use of each device. Resolution, detection range, depth of analysis, sensitivity and other details.