3D optical profilometer
3D optical profilometer
Analytics
Description:
The optical 3D profilometer is a high-precision measuring device for three-dimensional detection of the surface structure of objects.
It is based on optical interference technology and uses light waves to measure height differences on the surface. The profilometer generates a detailed image of the surface by analyzing the phase shift of the reflected light. This allows features such as roughness, curvature, unevenness and other surface parameters to be measured precisely.
Specifications:
| Attainable information: | topography (3D: lateral & height) |
| Materials: | solid materials with a usable sample size of 114 mm x 75 mm x 40 mm (L x W x H) |
| Measurement techniques: | confocal measurement, focus variation, interferometry (PSI, CSI), reflectometry (thin film) |
| Available wavelengths (LED): | red (630 nm), green (530 nm), blue (460 nm), and white |
| Objective lenses: | brightfield: 2.5×, 5×, 10×, 20×, 50×; interferometry: 10×, 50× |
| Optical resolution: | depending on the objective used, the measurement technique and the sample |
| Imaging: | high-resolution camera (2442 x 2048 pixels) |
| Special features: | no moving parts, differential interfe- rence contrast (DIC) |