• XRD system specialized on polycrystalline samples, powder samples and nanoparticles
• wide range scans (2θ) for phase analysis
• 0.001° goniometer resolution
• Rocking curves (ω) used to quantify grain size and mosaic spread in crystalline materials
• X-ray reflectivity (XRR) for determining thickness, roughness, and density of thin films (<200nm)
• Anode: Cu: non-monochromatized X-rays, with a weighted average wavelength of 0.15418 nm
• Incident beam optics: Programmable Divergence Slit with beam attenuator, Mirror for parallel beam
• Sample stages: Bracket, Spinner (for powder), Capillary Spinner (for particles in solution), IR-Stage (for thin films)
• Diffracted beam optics: PRS/PASS & curved monochromator, parallel plate collimator (& flat monochromator)
• Detectors: Panalytical X'Celerator (high speed, high accuracy), large area proportional counter (for parallel beam optics, XRR)

Contact:
M. Farle
M. Acet

5 - Axis-sample stage - infrared controlled

• 2Theta/Theta (automatic)
• Omega (manual)
• Psi (manual)
• Phi (manual)

Bracket stage

• 2Theta/Theta (automatic)

Spinner sample stage

• 2Theta/Theta (automatic)
• adjustable constant velocity

Capillary spinner sample stage

• 2Theta/Theta (automatic)
• constant velocity